| HLÁVKA, Jan, Ivan OHLÍDAL and František VIŽĎA. New Technique of Measurement of Optical Parameters of thin Films. Thin Solid Films. Oxford, UK: Elsevier science, 1996, vol. 279, p. 209-212. ISSN 0040-6090. |
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@article{197459,
author = {Hlávka, Jan and Ohlídal, Ivan and Vižďa, František},
article_location = {Oxford, UK},
keywords = {Optical properties; Photovoltage; Semiconductors},
language = {eng},
issn = {0040-6090},
journal = {Thin Solid Films},
title = {New Technique of Measurement of Optical Parameters of thin Films},
volume = {279},
year = {1996}
}
TY - JOUR
ID - 197459
AU - Hlávka, Jan - Ohlídal, Ivan - Vižďa, František
PY - 1996
TI - New Technique of Measurement of Optical Parameters of thin Films
JF - Thin Solid Films
VL - 279
SP - 209
EP - 209
PB - Elsevier science
SN - 00406090
KW - Optical properties
KW - Photovoltage
KW - Semiconductors
ER -
HLÁVKA, Jan, Ivan OHLÍDAL and František VIŽĎA. New Technique of Measurement of Optical Parameters of thin Films. \textit{Thin Solid Films}. Oxford, UK: Elsevier science, 1996, vol.~279, p.~209-212. ISSN~0040-6090.
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