HLÁVKA, Jan, Ivan OHLÍDAL and František VIŽĎA. New Technique of Measurement of Optical Parameters of thin Films. Thin Solid Films. Oxford, UK: Elsevier science, 1996, vol. 279, p. 209-212. ISSN 0040-6090. |
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@article{197459, author = {Hlávka, Jan and Ohlídal, Ivan and Vižďa, František}, article_location = {Oxford, UK}, keywords = {Optical properties; Photovoltage; Semiconductors}, language = {eng}, issn = {0040-6090}, journal = {Thin Solid Films}, title = {New Technique of Measurement of Optical Parameters of thin Films}, volume = {279}, year = {1996} }
TY - JOUR ID - 197459 AU - Hlávka, Jan - Ohlídal, Ivan - Vižďa, František PY - 1996 TI - New Technique of Measurement of Optical Parameters of thin Films JF - Thin Solid Films VL - 279 SP - 209 EP - 209 PB - Elsevier science SN - 00406090 KW - Optical properties KW - Photovoltage KW - Semiconductors ER -
HLÁVKA, Jan, Ivan OHLÍDAL and František VIŽĎA. New Technique of Measurement of Optical Parameters of thin Films. \textit{Thin Solid Films}. Oxford, UK: Elsevier science, 1996, vol.~279, p.~209-212. ISSN~0040-6090.
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