New Technique of Measurement of Optical Parameters of thin Films

HLÁVKA, Jan, Ivan OHLÍDAL and František VIŽĎA. New Technique of Measurement of Optical Parameters of thin Films. Thin Solid Films. Oxford, UK: Elsevier science, 1996, vol. 279, p. 209-212. ISSN 0040-6090.

Basic information

Original name

New Technique of Measurement of Optical Parameters of thin Films

Authors

HLÁVKA, Jan, Ivan OHLÍDAL and František VIŽĎA

Edition

Thin Solid Films, Oxford, UK, Elsevier science, 1996, 0040-6090

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Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10301 Atomic, molecular and chemical physics

Confidentiality degree

není předmětem státního či obchodního tajemství

Organization unit

Faculty of Science

UT WoS

A1996VB37200040

Keywords in English

Optical properties; Photovoltage; Semiconductors

Tags

Optical properties, Photovoltage, Semiconductors