OHLÍDAL, Ivan and Karel NAVRÁTIL. Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1997, vol. 42, No 3, p. 76-79. ISSN 0447-6441. |
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@article{197822, author = {Ohlídal, Ivan and Navrátil, Karel}, article_location = {Přerov}, article_number = {3}, language = {eng}, issn = {0447-6441}, journal = {Jemná mechanika a optika}, title = {Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry}, volume = {42}, year = {1997} }
TY - JOUR ID - 197822 AU - Ohlídal, Ivan - Navrátil, Karel PY - 1997 TI - Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry JF - Jemná mechanika a optika VL - 42 IS - 3 SP - 76 EP - 76 PB - Physical Institute, ASCR SN - 04476441 ER -
OHLÍDAL, Ivan and Karel NAVRÁTIL. Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry. \textit{Jemná mechanika a optika}. Přerov: Physical Institute, ASCR, 1997, vol.~42, No~3, p.~76-79. ISSN~0447-6441.
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