Optical analysis of weakly absorbing inhomogeneous thin films
by means of the envelope method of spectroscopic reflectometry

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Publications Detailed Information on Publication Record

Detailed Information on Publication Record

J 1997

Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry

OHLÍDAL, Ivan and Karel NAVRÁTIL

Basic information

Original name

Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry

Authors

OHLÍDAL, Ivan and Karel NAVRÁTIL

Edition

Jemná mechanika a optika, Přerov, Physical Institute, ASCR, 1997, 0447-6441

Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10306 Optics

Country of publisher

Czech Republic

Confidentiality degree

není předmětem státního či obchodního tajemství

Organization unit

Faculty of Science

Změněno: 6/3/2000 18:15, prof. RNDr. Ivan Ohlídal, DrSc.

OHLÍDAL, Ivan and Karel NAVRÁTIL. Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1997, vol. 42, No 3, p. 76-79. ISSN 0447-6441.

@article{197822,
   author = {Ohlídal, Ivan and Navrátil, Karel},
   article_location = {Přerov},
   article_number = {3},
   language = {eng},
   issn = {0447-6441},
   journal = {Jemná mechanika a optika},
   title = {Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry},
   volume = {42},
   year = {1997}
}

TY  - JOUR
ID  - 197822
AU  - Ohlídal, Ivan - Navrátil, Karel
PY  - 1997
TI  - Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry
JF  - Jemná mechanika a optika
VL  - 42
IS  - 3
SP  - 76
EP  - 76
PB  - Physical Institute, ASCR
SN  - 04476441
ER  -

OHLÍDAL, Ivan and Karel NAVRÁTIL. Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry. \textit{Jemná mechanika a optika}. Přerov: Physical Institute, ASCR, 1997, vol.~42, No~3, p.~76-79. ISSN~0447-6441.