HUMLÍČEK, Josef. Infrared ellipsometry of LiF. Thin Solid Films. UK Oxford: Elsevier science, 1998, vol. 1998, 313-314, p. 687-691. ISSN 0040-6090.
Other formats:   BibTeX LaTeX RIS
Basic information
Original name Infrared ellipsometry of LiF
Authors HUMLÍČEK, Josef.
Edition Thin Solid Films, UK Oxford, Elsevier science, 1998, 0040-6090.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher United Kingdom of Great Britain and Northern Ireland
Confidentiality degree is not subject to a state or trade secret
Impact factor Impact factor: 1.019
RIV identification code RIV/00216224:14310/98:00000753
Organization unit Faculty of Science
UT WoS 000073761700125
Keywords in English ellipsometry
Tags ellipsometry
Changed by Changed by: prof. RNDr. Josef Humlíček, CSc., učo 307. Changed: 10/1/2000 15:39.
Links
MSM 143100002, plan (intention)Name: Fyzikální vlastnosti nových materiálů a vrstevnatých struktur
Investor: Ministry of Education, Youth and Sports of the CR, Physical properties of new materials and layered structures
PrintDisplayed: 10/5/2024 23:46