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@article{200253, author = {Humlíček, Josef}, article_location = {UK Oxford}, article_number = {313-314}, keywords = {ellipsometry}, language = {eng}, issn = {0040-6090}, journal = {Thin Solid Films}, title = {Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys}, volume = {1998}, year = {1998} }
TY - JOUR ID - 200253 AU - Humlíček, Josef PY - 1998 TI - Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys JF - Thin Solid Films VL - 1998 IS - 313-314 SP - 656 EP - 656 PB - Elsevier science SN - 00406090 KW - ellipsometry ER -
HUMLÍČEK, Josef. Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys. \textit{Thin Solid Films}. UK Oxford: Elsevier science, 1998, vol.~1998, 313-314, p.~656-660. ISSN~0040-6090.
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