JERGEL, M., Václav HOLÝ, E. MAJKOVÁ, S. LUBY, R. SENDERÁK, H.J. STOCK, D. MENKE, U. KLEINEBERG a U. HEINZMANN. X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics. Physica B condensed matter. Amsterdam: Elsevier Science, 1998, roč. 253(1998), -, s. 28-39. ISSN 0921-4526. |
Další formáty:
BibTeX
LaTeX
RIS
@article{200356, author = {Jergel, M. and Holý, Václav and Majková, E. and Luby, S. and Senderák, R. and Stock, H.J. and Menke, D. and Kleineberg, U. and Heinzmann, U.}, article_location = {Amsterdam}, article_number = {-}, language = {eng}, issn = {0921-4526}, journal = {Physica B condensed matter}, title = {X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics}, volume = {253(1998)}, year = {1998} }
TY - JOUR ID - 200356 AU - Jergel, M. - Holý, Václav - Majková, E. - Luby, S. - Senderák, R. - Stock, H.J. - Menke, D. - Kleineberg, U. - Heinzmann, U. PY - 1998 TI - X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics JF - Physica B condensed matter VL - 253(1998) IS - - SP - 28 EP - 28 PB - Elsevier Science SN - 09214526 ER -
JERGEL, M., Václav HOLÝ, E. MAJKOVÁ, S. LUBY, R. SENDERÁK, H.J. STOCK, D. MENKE, U. KLEINEBERG a U. HEINZMANN. X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics. \textit{Physica B condensed matter}. Amsterdam: Elsevier Science, 1998, roč.~253(1998), -, s.~28-39. ISSN~0921-4526.
|