OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL, Martin VIČAR and Petr KLAPETEK. Comparison of AFM and optical methods at measuring nanometric surface roughness. In Proceedings of the 3th Seminar on Quantitative Microscopy. Braunschweig, SRN: Physikalisch-Technische Bundesanstalt, 1998, p. 123-129. ISBN 3-89701-280-4. |
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@inproceedings{206012, author = {Ohlídal, Ivan and Franta, Daniel and Ohlídal, Miloslav and Vičar, Martin and Klapetek, Petr}, address = {Braunschweig, SRN}, booktitle = {Proceedings of the 3th Seminar on Quantitative Microscopy}, language = {eng}, location = {Braunschweig, SRN}, isbn = {3-89701-280-4}, pages = {123-129}, publisher = {Physikalisch-Technische Bundesanstalt}, title = {Comparison of AFM and optical methods at measuring nanometric surface roughness}, url = {http://hydra.physics.muni.cz/~franta/bib/PTBF34_123.html}, year = {1998} }
TY - JOUR ID - 206012 AU - Ohlídal, Ivan - Franta, Daniel - Ohlídal, Miloslav - Vičar, Martin - Klapetek, Petr PY - 1998 TI - Comparison of AFM and optical methods at measuring nanometric surface roughness PB - Physikalisch-Technische Bundesanstalt CY - Braunschweig, SRN SN - 3897012804 UR - http://hydra.physics.muni.cz/~franta/bib/PTBF34_123.html N2 - In this contribution a comparison of the values of basic quantities characterizing random nanometric surface roughness determined by AFM and optical methods is presented. ER -
OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL, Martin VIČAR and Petr KLAPETEK. Comparison of AFM and optical methods at measuring nanometric surface roughness. In \textit{Proceedings of the 3th Seminar on Quantitative Microscopy}. Braunschweig, SRN: Physikalisch-Technische Bundesanstalt, 1998, p.~123-129. ISBN~3-89701-280-4.
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