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@article{206015, author = {Franta, Daniel and Ohlídal, Ivan}, article_location = {Amsterdam}, article_number = {1}, keywords = {Near-field optics; Speckle effect; Rough thin films}, language = {eng}, issn = {0030-4018}, journal = {Optics Communications}, title = {Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries}, url = {http://hydra.physics.muni.cz/~franta/bib/OC147_349.html}, volume = {147}, year = {1998} }
TY - JOUR ID - 206015 AU - Franta, Daniel - Ohlídal, Ivan PY - 1998 TI - Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries JF - Optics Communications VL - 147 IS - 1 SP - 349 EP - 349 PB - Elsevier Science SN - 00304018 KW - Near-field optics KW - Speckle effect KW - Rough thin films UR - http://hydra.physics.muni.cz/~franta/bib/OC147_349.html N2 - In this theoretical paper the basic statistical quantities of the light intensity above thin-film systems with randomly rough boundaries are studied in the near-field. This means that formulae for the mean intensity, standard deviation of the intensity, correlation function of the intensity and the speckle contrast are derived for the systems mentioned in the near-field. It is assumed that the boundaries of the systems are slightly rough, i.e. that the rms values of heights of the irregularities of the boundaries are much smaller than the wavelength of incident light. The Rayleigh-Rice approach is employed for deriving the formulae expressing the quantities specified. In conclusion a brief numerical analysis of the theoretical results is presented. ER -
FRANTA, Daniel and Ivan OHLÍDAL. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries. \textit{Optics Communications}. Amsterdam: Elsevier Science, 1998, vol.~147, No~1, p.~349-358. ISSN~0030-4018.
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