FRANTA, Daniel and Ivan OHLÍDAL. Ellipsometric parameters and reflectances of thin films with slightly rough boundaries. Journal of modern optics. Londýn: Taylor & Francis Ltd., 1998, vol. 45, No 5, p. 903-934. ISSN 0950-0340.
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Basic information
Original name Ellipsometric parameters and reflectances of thin films with slightly rough boundaries
Authors FRANTA, Daniel (203 Czech Republic, guarantor) and Ivan OHLÍDAL (203 Czech Republic).
Edition Journal of modern optics, Londýn, Taylor & Francis Ltd. 1998, 0950-0340.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10306 Optics
Country of publisher United Kingdom of Great Britain and Northern Ireland
Confidentiality degree is not subject to a state or trade secret
WWW URL
Impact factor Impact factor: 1.165
RIV identification code RIV/00216224:14310/98:00003213
Organization unit Faculty of Science
UT WoS 000073467700003
Changed by Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 19/12/2003 19:32.
Abstract
In this theoretical paper formulae for important optical quantities of single layers with slightly randomly rough boundaries are derived by means of a generalized Rayleigh-Rice theory. Thus the formulae for the specular reflectances, ellipsometric parameters and flux of scattered energy of the layers mentioned are presented. The theoretical results are illustrated by a numerical analysis. Practical features implied by this analysis to be relevant from the experimental point of view are introduced as well.
Links
GA202/98/0988, research and development projectName: Charakterizace vrstevnatých systémů s náhodně drsnými rozhraními pomocí optických a rtg metod
Investor: Czech Science Foundation, Characterization of multilayer systems with randomly rough boundaries by means of optical and X - ray methods
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