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@article{206016, author = {Franta, Daniel and Ohlídal, Ivan}, article_location = {Londýn}, article_number = {5}, language = {eng}, issn = {0950-0340}, journal = {Journal of modern optics}, title = {Ellipsometric parameters and reflectances of thin films with slightly rough boundaries}, url = {http://hydra.physics.muni.cz/~franta/bib/JMO45_903.html}, volume = {45}, year = {1998} }
TY - JOUR ID - 206016 AU - Franta, Daniel - Ohlídal, Ivan PY - 1998 TI - Ellipsometric parameters and reflectances of thin films with slightly rough boundaries JF - Journal of modern optics VL - 45 IS - 5 SP - 903 EP - 903 PB - Taylor & Francis Ltd. SN - 09500340 UR - http://hydra.physics.muni.cz/~franta/bib/JMO45_903.html N2 - In this theoretical paper formulae for important optical quantities of single layers with slightly randomly rough boundaries are derived by means of a generalized Rayleigh-Rice theory. Thus the formulae for the specular reflectances, ellipsometric parameters and flux of scattered energy of the layers mentioned are presented. The theoretical results are illustrated by a numerical analysis. Practical features implied by this analysis to be relevant from the experimental point of view are introduced as well. ER -
FRANTA, Daniel and Ivan OHLÍDAL. Ellipsometric parameters and reflectances of thin films with slightly rough boundaries. \textit{Journal of modern optics}. Londýn: Taylor \&{} Francis Ltd., 1998, vol.~45, No~5, p.~903-934. ISSN~0950-0340.
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