OHLÍDAL, Miloslav, Marek UNČOVSKÝ, Ivan OHLÍDAL and Daniel FRANTA. Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering. Journal of modern optics. Londýn: Taylor & Francis Ltd., 1999, vol. 46, No 2, p. 279-293. ISSN 0950-0340.
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Basic information
Original name Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering
Authors OHLÍDAL, Miloslav (guarantor), Marek UNČOVSKÝ, Ivan OHLÍDAL (203 Czech Republic) and Daniel FRANTA (203 Czech Republic).
Edition Journal of modern optics, Londýn, Taylor & Francis Ltd. 1999, 0950-0340.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher United Kingdom of Great Britain and Northern Ireland
Confidentiality degree is not subject to a state or trade secret
WWW URL
Impact factor Impact factor: 1.475
RIV identification code RIV/00216224:14310/99:00003214
Organization unit Faculty of Science
UT WoS 000078435800009
Changed by Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 22/12/2003 00:12.
Abstract
A method of determination of the basic morphology parameters of rough metal surfaces with periodic and random components of surface roughness by means of laser light scattering is presented. The method is based on interpreting the angular distribution of the laser light intensity scattered from such surfaces. The theory of the method is based on the scalar theory of diffraction and basic theorems of data processing. The new, more general way of interpreting experimental data is specified. It can also be used for the analysis of samples with quasiperiodic and random components of surface roughness; this is the case when standard measurement by means of stylus profilometer can give incorrect results.
Links
GA202/98/0988, research and development projectName: Charakterizace vrstevnatých systémů s náhodně drsnými rozhraními pomocí optických a rtg metod
Investor: Czech Science Foundation, Characterization of multilayer systems with randomly rough boundaries by means of optical and X - ray methods
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