OHLÍDAL, Ivan. Optical methods for surface characterization. In 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p. 429-440. SPIE Proceeding Series, Volume 3820. ISBN 0-8194-3306-3. |
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@inproceedings{207572, author = {Ohlídal, Ivan}, address = {Bellingham, Washington, USA}, booktitle = {11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics}, keywords = {Optical methods; Solid surfaces Thin films}, language = {eng}, location = {Bellingham, Washington, USA}, isbn = {0-8194-3306-3}, pages = {429-440}, publisher = {SPIE - The International Society for Optical Engineering}, title = {Optical methods for surface characterization}, year = {1999} }
TY - JOUR ID - 207572 AU - Ohlídal, Ivan PY - 1999 TI - Optical methods for surface characterization VL - SPIE Proceeding Series, Volume 3820 PB - SPIE - The International Society for Optical Engineering CY - Bellingham, Washington, USA SN - 0819433063 KW - Optical methods KW - Solid surfaces Thin films N2 - In this review paper a survey of the most significant optical methods usable for characterizing solid surfaces is performed. Examples allowing to show practical features of applying these methods at investigatinthe surfaces mentioned are presented too. By means of these examples both a reliability and accuracy of the methods are namely demonstrated. ER -
OHLÍDAL, Ivan. Optical methods for surface characterization. In \textit{11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics}. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p.~429-440. SPIE Proceeding Series, Volume 3820. ISBN~0-8194-3306-3.
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