OHLÍDAL, Ivan. Optical methods for surface characterization. In 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p. 429-440. SPIE Proceeding Series, Volume 3820. ISBN 0-8194-3306-3.
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Basic information
Original name Optical methods for surface characterization
Authors OHLÍDAL, Ivan.
Edition Bellingham, Washington, USA, 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, p. 429-440, SPIE Proceeding Series, Volume 3820, 1999.
Publisher SPIE - The International Society for Optical Engineering
Other information
Original language English
Type of outcome Proceedings paper
Field of Study 10302 Condensed matter physics
Country of publisher United States of America
Confidentiality degree is not subject to a state or trade secret
RIV identification code RIV/00216224:14310/99:00003216
Organization unit Faculty of Science
ISBN 0-8194-3306-3
Keywords in English Optical methods; Solid surfaces Thin films
Tags optical methods, Solid surfaces Thin films
Changed by Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 25/1/2001 15:48.
Abstract
In this review paper a survey of the most significant optical methods usable for characterizing solid surfaces is performed. Examples allowing to show practical features of applying these methods at investigatinthe surfaces mentioned are presented too. By means of these examples both a reliability and accuracy of the methods are namely demonstrated.
Links
GA202/98/0988, research and development projectName: Charakterizace vrstevnatých systémů s náhodně drsnými rozhraními pomocí optických a rtg metod
Investor: Czech Science Foundation, Characterization of multilayer systems with randomly rough boundaries by means of optical and X - ray methods
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