Detailed Information on Publication Record
1999
Optical characterization of multilayer systems with randomly rough boundaries
OHLÍDAL, Ivan, František VIŽĎA and Miloslav OHLÍDALBasic information
Original name
Optical characterization of multilayer systems with randomly rough boundaries
Authors
OHLÍDAL, Ivan, František VIŽĎA and Miloslav OHLÍDAL
Edition
Billingham, Washington, USA, 18th Congress of the International Commision for Optics: Optics for the Next Millennium, p. 150-151, SPIE Volume 3749, 1999
Publisher
SPIE - The International Society for Optical Engineering
Other information
Language
English
Type of outcome
Stať ve sborníku
Field of Study
10302 Condensed matter physics
Country of publisher
United States of America
Confidentiality degree
není předmětem státního či obchodního tajemství
RIV identification code
RIV/00216224:14310/99:00003217
Organization unit
Faculty of Science
ISBN
0-8194-3234-2
UT WoS
000082790200065
Keywords in English
multilayer systems; rough boundaries; coherent reflectance; optical characterization
Změněno: 27/2/2001 13:00, prof. RNDr. Ivan Ohlídal, DrSc.
Abstract
V originále
In this contribution examples of the optical characterization of multilayer systems with randomly rough boundaries are presented. The method based on measuring and interpreting the spectral dependences of the coherent reflectance is used to determine the values of the optical and statistical parameters of sample of three-layer and thirteen-layer systems exhibiting the rough boundaries. The systems mentioned are formed by thin films of SiO2 and TiO2.
Links
| GA202/98/0988, research and development project |
| ||
| MO50170896306, research and development project | |||