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@inproceedings{207732,
author = {Ohlídal, Ivan and Vižďa, František and Ohlídal, Miloslav},
address = {Billingham, Washington, USA},
booktitle = {18th Congress of the International Commision for Optics: Optics for the Next Millennium},
keywords = {multilayer systems; rough boundaries; coherent reflectance; optical characterization},
language = {eng},
location = {Billingham, Washington, USA},
isbn = {0-8194-3234-2},
pages = {150-151},
publisher = {SPIE - The International Society for Optical Engineering},
title = {Optical characterization of multilayer systems with randomly rough boundaries},
year = {1999}
}
TY - JOUR
ID - 207732
AU - Ohlídal, Ivan - Vižďa, František - Ohlídal, Miloslav
PY - 1999
TI - Optical characterization of multilayer systems with randomly rough boundaries
VL - SPIE Volume 3749
PB - SPIE - The International Society for Optical Engineering
CY - Billingham, Washington, USA
SN - 0819432342
KW - multilayer systems
KW - rough boundaries
KW - coherent reflectance
KW - optical characterization
N2 - In this contribution examples of the optical characterization of multilayer systems with randomly rough boundaries are presented. The method based on measuring and interpreting the spectral dependences of the coherent reflectance is used to determine the values of the optical and statistical parameters of sample of three-layer and thirteen-layer systems exhibiting the rough boundaries. The systems mentioned are formed by thin films of SiO2 and TiO2.
ER -
OHLÍDAL, Ivan, František VIŽĎA and Miloslav OHLÍDAL. Optical characterization of multilayer systems with randomly rough boundaries. In \textit{18th Congress of the International Commision for Optics: Optics for the Next Millennium}. Billingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p.~150-151. SPIE Volume 3749. ISBN~0-8194-3234-2.
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