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@inproceedings{207732, author = {Ohlídal, Ivan and Vižďa, František and Ohlídal, Miloslav}, address = {Billingham, Washington, USA}, booktitle = {18th Congress of the International Commision for Optics: Optics for the Next Millennium}, keywords = {multilayer systems; rough boundaries; coherent reflectance; optical characterization}, language = {eng}, location = {Billingham, Washington, USA}, isbn = {0-8194-3234-2}, pages = {150-151}, publisher = {SPIE - The International Society for Optical Engineering}, title = {Optical characterization of multilayer systems with randomly rough boundaries}, year = {1999} }
TY - JOUR ID - 207732 AU - Ohlídal, Ivan - Vižďa, František - Ohlídal, Miloslav PY - 1999 TI - Optical characterization of multilayer systems with randomly rough boundaries VL - SPIE Volume 3749 PB - SPIE - The International Society for Optical Engineering CY - Billingham, Washington, USA SN - 0819432342 KW - multilayer systems KW - rough boundaries KW - coherent reflectance KW - optical characterization N2 - In this contribution examples of the optical characterization of multilayer systems with randomly rough boundaries are presented. The method based on measuring and interpreting the spectral dependences of the coherent reflectance is used to determine the values of the optical and statistical parameters of sample of three-layer and thirteen-layer systems exhibiting the rough boundaries. The systems mentioned are formed by thin films of SiO2 and TiO2. ER -
OHLÍDAL, Ivan, František VIŽĎA and Miloslav OHLÍDAL. Optical characterization of multilayer systems with randomly rough boundaries. In \textit{18th Congress of the International Commision for Optics: Optics for the Next Millennium}. Billingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p.~150-151. SPIE Volume 3749. ISBN~0-8194-3234-2.
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