ŠULC, Václav, Jiří VOHÁNKA, Ivan OHLÍDAL, Petr KLAPETEK, Miloslav OHLÍDAL, Nupinder Jeet KAUR and František VIŽĎA. Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory. Coatings. MDPI, 2023, vol. 13, No 11, p. 1-15. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings13111853. |
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@article{2355407, author = {Šulc, Václav and Vohánka, Jiří and Ohlídal, Ivan and Klapetek, Petr and Ohlídal, Miloslav and Kaur, Nupinder Jeet and Vižďa, František}, article_number = {11}, doi = {http://dx.doi.org/10.3390/coatings13111853}, keywords = {roughness; scalar diffraction theory; angle-resolved scattering}, language = {eng}, issn = {2079-6412}, journal = {Coatings}, title = {Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory}, url = {https://doi.org/10.3390/coatings13111853}, volume = {13}, year = {2023} }
TY - JOUR ID - 2355407 AU - Šulc, Václav - Vohánka, Jiří - Ohlídal, Ivan - Klapetek, Petr - Ohlídal, Miloslav - Kaur, Nupinder Jeet - Vižďa, František PY - 2023 TI - Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory JF - Coatings VL - 13 IS - 11 SP - 1-15 EP - 1-15 PB - MDPI SN - 20796412 KW - roughness KW - scalar diffraction theory KW - angle-resolved scattering UR - https://doi.org/10.3390/coatings13111853 N2 - Angle-resolved scattering was measured for four samples of silicon exhibiting different surface roughnesses. The measurements were performed for three wavelengths: 457.9 nm, 514.5 nm, and 647.1 nm. Three approaches were used to evaluate the experimental data. The first approach corresponds to the exact formula derived using the scalar diffraction theory. This formula is quite complicated, and numerical methods must be used for its evaluation. For this reason, another two approaches representing approximations by much simpler formulae were considered. The use of several wavelengths allowed us not only to recover the power spectral density function in a limited interval of spatial frequencies but also to determine the total rms values of the heights, which represent the quantity of roughness for all spatial frequencies. The possibility of recovering the total rms values of the heights using the multi-wavelength approach is the most important result of this work. The results obtained from the scattering experiment and atomic force microscopy are compared. ER -
ŠULC, Václav, Jiří VOHÁNKA, Ivan OHLÍDAL, Petr KLAPETEK, Miloslav OHLÍDAL, Nupinder Jeet KAUR and František VIŽĎA. Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory. \textit{Coatings}. MDPI, 2023, vol.~13, No~11, p.~1-15. ISSN~2079-6412. Available from: https://dx.doi.org/10.3390/coatings13111853.
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