Detailed Information on Publication Record
2024
Electronic properties of Fe impurities in SnS van der Waals crystals – Revealing high-mobility holes
NAVRÁTIL, J., Ondřej CAHA, J. KOPEČEK, P. ČERMÁK, J. PROKLEŠKA et. al.Basic information
Original name
Electronic properties of Fe impurities in SnS van der Waals crystals – Revealing high-mobility holes
Authors
NAVRÁTIL, J., Ondřej CAHA (203 Czech Republic, belonging to the institution), J. KOPEČEK, P. ČERMÁK, J. PROKLEŠKA, Václav HOLÝ (203 Czech Republic, belonging to the institution), V. SECHOVSKÝ, L. BENEŠ, K. CARVA, J. HONOLKA and Č. DRAŠAR
Edition
Materials Science and Engineering: B, Elsevier, 2024, 0921-5107
Other information
Language
English
Type of outcome
Článek v odborném periodiku
Field of Study
10302 Condensed matter physics
Country of publisher
Netherlands
Confidentiality degree
není předmětem státního či obchodního tajemství
References:
Impact factor
Impact factor: 3.600 in 2022
Organization unit
Faculty of Science
UT WoS
001155796300001
Keywords in English
p-type SnS; Single crystal; Semiconductor; Doping; Electrical properties
Tags
Tags
International impact, Reviewed
Změněno: 28/2/2024 11:50, Mgr. Marie Šípková, DiS.
Abstract
V originále
Defect control is critical to achieve long carrier lifetimes in semiconductors. SnS is a promising thermoelectric and photovoltaic material, in which native defects play a detrimental role, particularly in photovoltaics. In this study, we investigated the Fe-doping of SnS and the interaction of Fe impurities with native defects in a series of single crystals of Sn1-xFexS up to concentrations of x = 0.05. Although the doped single crystals appear rather disordered, the hole mobility is very high (∼8500 cm2V-1s−1 at 30 K for Sn0.99Fe0.01S), suggesting that hole-mediated charge transport in this material is largely insensitive to extrinsic impurities. Charge transport analysis suggests that the incorporation of Fe atoms leads to the healing of the intrinsic defect structure and the exclusion of minority electrons from charge transport, allowing the observation of high hole mobility.
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