Depth profiling of W–Ta based fusion-relevant samples using
picosecond laser ablation

J 2024

Depth profiling of W–Ta based fusion-relevant samples using picosecond laser ablation

SONI, Shweta, Sahithya ATIKUKKE, Matej VEIS, Nima BOLOUKI, Pavol ĎURINA et. al.

Basic information

Original name

Depth profiling of W–Ta based fusion-relevant samples using picosecond laser ablation

Authors

SONI, Shweta, Sahithya ATIKUKKE, Matej VEIS, Nima BOLOUKI (364 Islamic Republic of Iran, belonging to the institution), Pavol ĎURINA, Pavel DVOŘÁK (203 Czech Republic, belonging to the institution), Martina MRKVIČKOVÁ (203 Czech Republic, belonging to the institution), Eduard GRIGORE and Pavel VEIS

Edition

Spectrochimica Acta Part B: Atomic Spectroscopy, Elsevier B.V. 2024, 0584-8547

Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10305 Fluids and plasma physics

Country of publisher

United Kingdom of Great Britain and Northern Ireland

Confidentiality degree

není předmětem státního či obchodního tajemství

References:

URL

Impact factor

Impact factor: 3.300 in 2022

Organization unit

Faculty of Science

DOI

http://dx.doi.org/10.1016/j.sab.2024.106930

UT WoS

001272010800001

Keywords in English

Ps-LIBS; CF-LIBS; Tungsten; WTa(D); GDOES; Confocal microscopy; Depth profile; Ablation rate

Abstract

V originále

This study presents a detailed picosecond LIBS analysis of WTa coatings on Molybdenum substrate with varying layer thicknesses for fusion relevant applications. Ps-LIBS is performed on three WTa layers; two without deuterium (∼7 μm thickness) and one with deuterium (∼1 μm thickness). The LIBS measurements are conducted under argon gas flow at 5±0.2 mbar pressure with different laser pulse energies (1 mJ, 3 mJ) and 100 spectra are recorded consecutively at one spot on the sample for different set of gate delay/gate width (200/200 ns, 300/300 ns, 450/450 ns). The obtained LIBS and Glow-Discharge Optical Emission Spectroscopy (GDOES) depth profiles are compared with the confocal microscopic measurements showing good agreement. Additionally, the ablation rate and layer thickness are calculated for different experimental conditions. The Calibration-Free LIBS approach is used for elemental analysis and the results are compared with GDOES results. The capability of ps-LIBS to quantify Ta in WTa alloy is explored for 2 at.% of Ta. However, due to higher ablation rate of laser and thin coating in WTaD sample, the layer is irradiated in few laser pulse and therefore, CF-LIBS analysis is not performed for it.

Links

LM2018097, research and development project

Name: Centrum výzkumu a vývoje plazmatu a nanotechnologických povrchových úprav (Acronym: CEPLANT)

Investor: Ministry of Education, Youth and Sports of the CR

Citovat

SONI, Shweta, Sahithya ATIKUKKE, Matej VEIS, Nima BOLOUKI, Pavol ĎURINA, Pavel DVOŘÁK, Martina MRKVIČKOVÁ, Eduard GRIGORE and Pavel VEIS. Depth profiling of W–Ta based fusion-relevant samples using picosecond laser ablation. Spectrochimica Acta Part B: Atomic Spectroscopy. Elsevier B.V., 2024, vol. 216, June 2024, p. 1-9. ISSN 0584-8547. Available from: https://dx.doi.org/10.1016/j.sab.2024.106930.

@article{2400058,
   author = {Soni, Shweta and Atikukke, Sahithya and Veis, Matej and Bolouki, Nima and Ďurina, Pavol and Dvořák, Pavel and Mrkvičková, Martina and Grigore, Eduard and Veis, Pavel},
   article_number = {June 2024},
   doi = {http://dx.doi.org/10.1016/j.sab.2024.106930},
   keywords = {Ps-LIBS; CF-LIBS; Tungsten; WTa(D); GDOES; Confocal microscopy; Depth profile; Ablation rate},
   language = {eng},
   issn = {0584-8547},
   journal = {Spectrochimica Acta Part B: Atomic Spectroscopy},
   title = {Depth profiling of W–Ta based fusion-relevant samples using picosecond laser ablation},
   url = {https://www.sciencedirect.com/science/article/pii/S0584854724000740},
   volume = {216},
   year = {2024}
}

TY  - JOUR
ID  - 2400058
AU  - Soni, Shweta - Atikukke, Sahithya - Veis, Matej - Bolouki, Nima - Ďurina, Pavol - Dvořák, Pavel - Mrkvičková, Martina - Grigore, Eduard - Veis, Pavel
PY  - 2024
TI  - Depth profiling of W–Ta based fusion-relevant samples using picosecond laser ablation
JF  - Spectrochimica Acta Part B: Atomic Spectroscopy
VL  - 216
IS  - June 2024
SP  - 1-9
EP  - 1-9
PB  - Elsevier B.V.
SN  - 05848547
KW  - Ps-LIBS
KW  - CF-LIBS
KW  - Tungsten
KW  - WTa(D)
KW  - GDOES
KW  - Confocal microscopy
KW  - Depth profile
KW  - Ablation rate
UR  - https://www.sciencedirect.com/science/article/pii/S0584854724000740
N2  - This study presents a detailed picosecond LIBS analysis of WTa coatings on Molybdenum substrate with varying layer thicknesses for fusion relevant applications. Ps-LIBS is performed on three WTa layers; two without deuterium (∼7 μm thickness) and one with deuterium (∼1 μm thickness). The LIBS measurements are conducted under argon gas flow at 5±0.2 mbar pressure with different laser pulse energies (1 mJ, 3 mJ) and 100 spectra are recorded consecutively at one spot on the sample for different set of gate delay/gate width (200/200 ns, 300/300 ns, 450/450 ns). The obtained LIBS and Glow-Discharge Optical Emission Spectroscopy (GDOES) depth profiles are compared with the confocal microscopic measurements showing good agreement. Additionally, the ablation rate and layer thickness are calculated for different experimental conditions. The Calibration-Free LIBS approach is used for elemental analysis and the results are compared with GDOES results. The capability of ps-LIBS to quantify Ta in WTa alloy is explored for 2 at.% of Ta. However, due to higher ablation rate of laser and thin coating in WTaD sample, the layer is irradiated in few laser pulse and therefore, CF-LIBS analysis is not performed for it.
ER  -

SONI, Shweta, Sahithya ATIKUKKE, Matej VEIS, Nima BOLOUKI, Pavol ĎURINA, Pavel DVOŘÁK, Martina MRKVIČKOVÁ, Eduard GRIGORE and Pavel VEIS. Depth profiling of W–Ta based fusion-relevant samples using picosecond laser ablation. \textit{Spectrochimica Acta Part B: Atomic Spectroscopy}. Elsevier B.V., 2024, vol.~216, June 2024, p.~1-9. ISSN~0584-8547. Available from: https://dx.doi.org/10.1016/j.sab.2024.106930.

Detailed Information on Publication Record