HNILICA, Jaroslav, Peter KLEIN, Martin UČÍK, Stanislava DEBNÁROVÁ, Jan KLUSOŇ and Petr VAŠINA. On direct-current magnetron sputtering at industrial conditions with high ionization fraction of sputtered species. Surface and Coatings Technology. Elsevier B.V., 2024, vol. 487, July 2024, p. 1-7. ISSN 0257-8972. Available from: https://dx.doi.org/10.1016/j.surfcoat.2024.131028.
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Basic information
Original name On direct-current magnetron sputtering at industrial conditions with high ionization fraction of sputtered species
Authors HNILICA, Jaroslav, Peter KLEIN, Martin UČÍK, Stanislava DEBNÁROVÁ, Jan KLUSOŇ and Petr VAŠINA.
Edition Surface and Coatings Technology, Elsevier B.V. 2024, 0257-8972.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10300 1.3 Physical sciences
Country of publisher Switzerland
Confidentiality degree is not subject to a state or trade secret
WWW URL
Impact factor Impact factor: 5.400 in 2022
Organization unit Faculty of Science
Doi http://dx.doi.org/10.1016/j.surfcoat.2024.131028
Keywords in English Titanium; Magnetron sputtering; Industry; HiPIMS; Coatings
Tags International impact, Reviewed
Changed by Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 8/7/2024 09:55.
Abstract
In the industry, there is a preference for robust and technologically straightforward solutions that can deliver desired products at reasonable costs. This study introduces a reliable, robust, and cost-effective ion-assisted thin film growth technique called moving focused magnetic field magnetron sputtering. At the core of this technology lies the generation of dense plasma within a small area of the target and the controlled movement of this plasma across the entire target surface. The deposition process, powered by a direct current generator, behaves similarly to high-power impulse magnetron sputtering and yields coatings with properties comparable to those produced by this method. Notably, this study marks the first application of an ion meter to measure the ionized metal flux fraction of sputtered titanium at industrial conditions, revealing values of up to 34% measured at the substrate position.
Links
LM2023039, research and development projectName: Centrum výzkumu a vývoje plazmatu a nanotechnologických povrchových úprav
Investor: Ministry of Education, Youth and Sports of the CR
PrintDisplayed: 14/7/2024 19:14