Detailed Information on Publication Record
2000
Matrix formalism for imperfect thin films
OHLÍDAL, Ivan and Daniel FRANTABasic information
Original name
Matrix formalism for imperfect thin films
Authors
OHLÍDAL, Ivan (203 Czech Republic, guarantor) and Daniel FRANTA (203 Czech Republic)
Edition
Acta physica slovaca, Bratislava, Institute of Physics, SAS, 2000, 0323-0465
Other information
Language
English
Type of outcome
Článek v odborném periodiku
Field of Study
10302 Condensed matter physics
Country of publisher
Slovakia
Confidentiality degree
není předmětem státního či obchodního tajemství
References:
Impact factor
Impact factor: 0.465
RIV identification code
RIV/00216224:14310/00:00002316
Organization unit
Faculty of Science
UT WoS
000088911400009
Změněno: 22/12/2003 00:46, Mgr. Daniel Franta, Ph.D.
Abstract
V originále
In this review paper a uniform matrix formalism enabling us to include the important defects of thin film systems into the formulae for their optical quantities is presented. The following defects are discussed: roughness of the boundaries; inhomogeneity represented by profiles of the refractive indices; transition interface layer and volume inhomogeneity. It is shown that this formalism is relatively very efficient. Thus fact is demonstrated using a theoretical example representing a complicated thin film system exhibiting defects.
Links
GA202/98/0988, research and development project |
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GV106/96/K245, research and development project |
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VS96084, research and development project |
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