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@inbook{345405, author = {Ohlídal, Ivan and Franta, Daniel}, address = {Amsterdam}, booktitle = {Progress in Optics, Vol. 41 (Ed. E. Wolf)}, edition = {1}, language = {eng}, location = {Amsterdam}, isbn = {0-444-568-7}, pages = {181-282}, publisher = {Elsevier}, title = {Ellipsometry of Thin Film Systems}, url = {http://hydra.physics.muni.cz/~franta/bib/PROGRESS41_181.html}, year = {2000} }
TY - CHAP ID - 345405 AU - Ohlídal, Ivan - Franta, Daniel PY - 2000 TI - Ellipsometry of Thin Film Systems PB - Elsevier CY - Amsterdam SN - 04445687 UR - http://hydra.physics.muni.cz/~franta/bib/PROGRESS41_181.html N2 - In this paper, a review of both the important theoretical and experimental results concerning ellipsometry is presented. ER -
OHLÍDAL, Ivan and Daniel FRANTA. Ellipsometry of Thin Film Systems. In \textit{Progress in Optics, Vol. 41 (Ed. E. Wolf)}. 1st ed. Amsterdam: Elsevier, 2000, p.~181-282. ISBN~0-444-568-7.
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