Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation

FRANTA, Daniel and Ivan OHLÍDAL. Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation. In 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2001, p. 207-212. ISBN 0-8194-4047-7.

Basic information

• Original name: Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation
• Authors: FRANTA, Daniel (203 Czech Republic, guarantor) and Ivan OHLÍDAL (203 Czech Republic).
• Edition: Bellingham, Washington, USA, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, p. 207-212, 6 pp. 2001.
• Publisher: SPIE - The International Society for Optical Engineering

Other information

• Original language: English
• Type of outcome: Proceedings paper
• Field of Study: 10306 Optics
• Country of publisher: United States of America
• Confidentiality degree: is not subject to a state or trade secret
• WWW: URL
• RIV identification code: RIV/00216224:14310/01:00004153
• Organization unit: Faculty of Science
• ISBN: 0-8194-4047-7
• Keywords in English: inhomogeneous thin films; optical quantities; matrix formalism; Drude approximation
• Tags: Drude approximation, inhomogeneous thin films, matrix formalism, optical quantities

Abstract

In this contribution a new mathematical procedure enabling us to calculate the optical quantities of the inhomogeneous thin films such as reflectance, transmittance and ellipsometric parameters will be described. This procedure is based on combining the known matrix formalism and Drude approximation. The inhomogeneous thin films is replaced by a multilayer system containing the thin films with a linear profiles of the dielectric function and different thicknesses. Every individual film of the multilayer system is described by the matrix corresponding to the Drude approximation. Using this procedure one can construct an efficient algorithm allowing to calculate the values of the optical quantities of the inhomogeneous thin films exhibiting great gradients of the refractive index profiles.

Links

• GA203/00/0085, research and development project: Name: Optické vlastnosti skel a amorfních tenkých vrstev sulfidů a selenidů

Investor: Czech Science Foundation, Optical properties of glasses and amorphous thin films of sulphides and selenides