FRANTA, Daniel, Ivan OHLÍDAL, Miloslav FRUMAR and Jaroslav JEDELSKÝ. Optical Characterization of Chalcogenide Thin Films. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2001, 175-176, No 1, p. 555-561. ISSN 0169-4332. |
Other formats:
BibTeX
LaTeX
RIS
@article{366091, author = {Franta, Daniel and Ohlídal, Ivan and Frumar, Miloslav and Jedelský, Jaroslav}, article_location = {USA}, article_number = {1}, keywords = {Chalcogenide films; Dispersion model; Ellipsometry; Reflectometry}, language = {eng}, issn = {0169-4332}, journal = {Applied Surface Science}, title = {Optical Characterization of Chalcogenide Thin Films}, url = {http://hydra.physics.muni.cz/~franta/bib/ASS175_555.html}, volume = {175-176}, year = {2001} }
TY - JOUR ID - 366091 AU - Franta, Daniel - Ohlídal, Ivan - Frumar, Miloslav - Jedelský, Jaroslav PY - 2001 TI - Optical Characterization of Chalcogenide Thin Films JF - Applied Surface Science VL - 175-176 IS - 1 SP - 555 EP - 555 PB - ELSEVIER (NORTH-HOLLAND) SN - 01694332 KW - Chalcogenide films KW - Dispersion model KW - Ellipsometry KW - Reflectometry UR - http://hydra.physics.muni.cz/~franta/bib/ASS175_555.html N2 - In this paper the optical characterization of a film of amorphous As-S chalcogenides evaporated on glass substrates will be performed using variable angle of incidence spectroscopic ellipsometry (VASE) and near normal incidence spectroscopic reflectometry (NNSR). The spectral dependences of the ellipsometric parameters and reflectance of the chalcogenide thin film mentioned is measured within the near-UV, visible and near-IR spectral regions. For interpreting these optical quantities the new dispersion model of the spectral dependences of the optical constants of amorphous solids is employed. This model is based on the modified Lorentz oscillator. Within this model the concepts of the band gap and Urbach tail are respected. ER -
FRANTA, Daniel, Ivan OHLÍDAL, Miloslav FRUMAR and Jaroslav JEDELSKÝ. Optical Characterization of Chalcogenide Thin Films. \textit{Applied Surface Science}. USA: ELSEVIER (NORTH-HOLLAND), 2001, 175-176, No~1, p.~555-561. ISSN~0169-4332.
|