Detailed Information on Publication Record
2001
Optical Characterization of Chalcogenide Thin Films
FRANTA, Daniel, Ivan OHLÍDAL, Miloslav FRUMAR and Jaroslav JEDELSKÝBasic information
Original name
Optical Characterization of Chalcogenide Thin Films
Authors
FRANTA, Daniel (203 Czech Republic, guarantor), Ivan OHLÍDAL (203 Czech Republic), Miloslav FRUMAR (203 Czech Republic) and Jaroslav JEDELSKÝ (203 Czech Republic)
Edition
Applied Surface Science, USA, ELSEVIER (NORTH-HOLLAND), 2001, 0169-4332
Other information
Language
English
Type of outcome
Článek v odborném periodiku
Field of Study
10302 Condensed matter physics
Country of publisher
United States of America
Confidentiality degree
není předmětem státního či obchodního tajemství
References:
Impact factor
Impact factor: 1.068
RIV identification code
RIV/00216224:14310/01:00004310
Organization unit
Faculty of Science
UT WoS
000169032100092
Keywords in English
Chalcogenide films; Dispersion model; Ellipsometry; Reflectometry
Změněno: 25/12/2003 00:41, Mgr. Daniel Franta, Ph.D.
Abstract
V originále
In this paper the optical characterization of a film of amorphous As-S chalcogenides evaporated on glass substrates will be performed using variable angle of incidence spectroscopic ellipsometry (VASE) and near normal incidence spectroscopic reflectometry (NNSR). The spectral dependences of the ellipsometric parameters and reflectance of the chalcogenide thin film mentioned is measured within the near-UV, visible and near-IR spectral regions. For interpreting these optical quantities the new dispersion model of the spectral dependences of the optical constants of amorphous solids is employed. This model is based on the modified Lorentz oscillator. Within this model the concepts of the band gap and Urbach tail are respected.
Links
| GA203/00/0085, research and development project |
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