Detailed Information on Publication Record
2001
Optical characterization of DLC:Si films prepared by PECVD
FRANTA, Daniel, Vilma BURŠÍKOVÁ and Lenka ZAJÍČKOVÁBasic information
Original name
Optical characterization of DLC:Si films prepared by PECVD
Authors
FRANTA, Daniel (203 Czech Republic, guarantor), Vilma BURŠÍKOVÁ (203 Czech Republic) and Lenka ZAJÍČKOVÁ (203 Czech Republic)
Edition
Bratislava (Slovakia), Proceedings of 13th Symposium on Application of Plasma Processes, p. 87-88, 2 pp. 2001
Publisher
Dept. of Plasma Physics & Inst. of Physics, Comenius University Bratislava (Slovakia)
Other information
Language
English
Type of outcome
Stať ve sborníku
Field of Study
10305 Fluids and plasma physics
Country of publisher
Slovakia
Confidentiality degree
není předmětem státního či obchodního tajemství
References:
RIV identification code
RIV/00216224:14310/01:00004615
Organization unit
Faculty of Science
ISBN
80-223-157
Tags
International impact
Změněno: 17/7/2007 17:45, doc. Mgr. Lenka Zajíčková, Ph.D.
Abstract
V originále
Multi-sample modification of variable angle of incidence spectroscopic ellipsometry (VASE) was used to characterize silicon doped diamond like carbon (DLC:Si) films prepared by plasma enhanced chemical vapor deposition (PECVD). These films were prepared on wafers of silicon single crystal in the planar capacitively coupled RF reactor. The gas feed for deposition was a mixture of methane (CH4), hexamethyldisiloxane (HMDSO) and argon (Ar).
Links
GA202/00/P037, research and development project |
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GA202/98/0988, research and development project |
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MSM 143100003, plan (intention) |
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OC 527.20, research and development project |
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