Complete Optical Analysis of Amorphous As-S Chalcogenide Thin
Films by the Combined Spectrophotometric Method

J 2001

Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method

OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ, Karel NAVRÁTIL et. al.

Basic information

Original name

Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method

Authors

OHLÍDAL, Ivan (203 Czech Republic, guarantor), Daniel FRANTA (203 Czech Republic), Miroslav FRUMAR, Jaroslav JEDELSKÝ and Karel NAVRÁTIL (203 Czech Republic)

Edition

Journal of Optoelectronics and Advanced Materials, Bucharest, INOE & INFM, 2001, 1454-4164

Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10302 Condensed matter physics

Country of publisher

Romania

Confidentiality degree

není předmětem státního či obchodního tajemství

References:

URL

Impact factor

Impact factor: 0.274

RIV identification code

RIV/00216224:14310/01:00005240

Organization unit

Faculty of Science

UT WoS

000172819600009

Keywords in English

As-S chalcogenide films; Combined spectrophotometric method; Amorphous materials; Optical constants

Abstract

V originále

In this paper a combined spectrophotometric method is used to analyzed As-S chalcogenide thin films. This method is based on the simultaneous interpretation of experimental data corresponding to the reflectance from the ambient side, reflectance from the substrate side and transmittance of the chalcogenide films deposited onto the glass substrate. It is shown that this method is usable for the optical characterization of the chalcogenide films even when these films exhibit an inhomogeneity formed by a refractive index profile. Within this method our dispersion model of the optical constants of amorphous materials is used. This means that the values of the dispersion parameters determining the spectral dependences of the optical constants of the As-S chalcogenide material are evaluated. In the paper the advantages of the combined method mentioned are discussed from the practical point of view.

Links

GA203/00/0085, research and development project

Name: Optické vlastnosti skel a amorfních tenkých vrstev sulfidů a selenidů

Investor: Czech Science Foundation, Optical properties of glasses and amorphous thin films of sulphides and selenides

MSM 143100002, plan (intention)

Name: Fyzikální vlastnosti nových materiálů a vrstevnatých struktur

Investor: Ministry of Education, Youth and Sports of the CR, Physical properties of new materials and layered structures

Citovat

OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ and Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2001, vol. 3, No 4, p. 873-878. ISSN 1454-4164.

@article{387372,
   author = {Ohlídal, Ivan and Franta, Daniel and Frumar, Miroslav and Jedelský, Jaroslav and Navrátil, Karel},
   article_location = {Bucharest},
   article_number = {4},
   keywords = {As-S chalcogenide films; Combined spectrophotometric method; Amorphous materials; Optical constants},
   language = {eng},
   issn = {1454-4164},
   journal = {Journal of Optoelectronics and Advanced Materials},
   title = {Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method},
   url = {http://hydra.physics.muni.cz/~franta/bib/JOAM3_873.html},
   volume = {3},
   year = {2001}
}

TY  - JOUR
ID  - 387372
AU  - Ohlídal, Ivan - Franta, Daniel - Frumar, Miroslav - Jedelský, Jaroslav - Navrátil, Karel
PY  - 2001
TI  - Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method
JF  - Journal of Optoelectronics and Advanced Materials
VL  - 3
IS  - 4
SP  - 873
EP  - 873
PB  - INOE & INFM
SN  - 14544164
KW  - As-S chalcogenide films
KW  - Combined spectrophotometric method
KW  - Amorphous materials
KW  - Optical constants
UR  - http://hydra.physics.muni.cz/~franta/bib/JOAM3_873.html
N2  - In this paper a combined spectrophotometric method is used to analyzed As-S chalcogenide thin films. This method is based on the simultaneous interpretation of experimental data corresponding to the reflectance from the ambient side, reflectance from the substrate side and transmittance of the chalcogenide films deposited onto the glass substrate. It is shown that this method is usable for the optical characterization of the chalcogenide films even when these films exhibit an inhomogeneity formed by a refractive index profile. Within this method our dispersion model of the optical constants of amorphous materials is used. This means that the values of the dispersion parameters determining the spectral dependences of the optical constants of the As-S chalcogenide material are evaluated. In the paper the advantages of the combined method mentioned are discussed from the practical point of view.
ER  -

OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ and Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. \textit{Journal of Optoelectronics and Advanced Materials}. Bucharest: INOE \&{} INFM, 2001, vol.~3, No~4, p.~873-878. ISSN~1454-4164.

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