OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ and Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2001, vol. 3, No 4, p. 873-878. ISSN 1454-4164. |
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@article{387372, author = {Ohlídal, Ivan and Franta, Daniel and Frumar, Miroslav and Jedelský, Jaroslav and Navrátil, Karel}, article_location = {Bucharest}, article_number = {4}, keywords = {As-S chalcogenide films; Combined spectrophotometric method; Amorphous materials; Optical constants}, language = {eng}, issn = {1454-4164}, journal = {Journal of Optoelectronics and Advanced Materials}, title = {Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method}, url = {http://hydra.physics.muni.cz/~franta/bib/JOAM3_873.html}, volume = {3}, year = {2001} }
TY - JOUR ID - 387372 AU - Ohlídal, Ivan - Franta, Daniel - Frumar, Miroslav - Jedelský, Jaroslav - Navrátil, Karel PY - 2001 TI - Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method JF - Journal of Optoelectronics and Advanced Materials VL - 3 IS - 4 SP - 873 EP - 873 PB - INOE & INFM SN - 14544164 KW - As-S chalcogenide films KW - Combined spectrophotometric method KW - Amorphous materials KW - Optical constants UR - http://hydra.physics.muni.cz/~franta/bib/JOAM3_873.html N2 - In this paper a combined spectrophotometric method is used to analyzed As-S chalcogenide thin films. This method is based on the simultaneous interpretation of experimental data corresponding to the reflectance from the ambient side, reflectance from the substrate side and transmittance of the chalcogenide films deposited onto the glass substrate. It is shown that this method is usable for the optical characterization of the chalcogenide films even when these films exhibit an inhomogeneity formed by a refractive index profile. Within this method our dispersion model of the optical constants of amorphous materials is used. This means that the values of the dispersion parameters determining the spectral dependences of the optical constants of the As-S chalcogenide material are evaluated. In the paper the advantages of the combined method mentioned are discussed from the practical point of view. ER -
OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ and Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. \textit{Journal of Optoelectronics and Advanced Materials}. Bucharest: INOE \&{} INFM, 2001, vol.~3, No~4, p.~873-878. ISSN~1454-4164.
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