Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method

OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ and Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2001, vol. 3, No 4, p. 873-878. ISSN 1454-4164.

Basic information

• Original name: Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method
• Authors: OHLÍDAL, Ivan (203 Czech Republic, guarantor), Daniel FRANTA (203 Czech Republic), Miroslav FRUMAR, Jaroslav JEDELSKÝ and Karel NAVRÁTIL (203 Czech Republic).
• Edition: Journal of Optoelectronics and Advanced Materials, Bucharest, INOE & INFM, 2001, 1454-4164.

Other information

• Original language: English
• Type of outcome: Article in a journal
• Field of Study: 10302 Condensed matter physics
• Country of publisher: Romania
• Confidentiality degree: is not subject to a state or trade secret
• WWW: URL
• Impact factor: Impact factor: 0.274
• RIV identification code: RIV/00216224:14310/01:00005240
• Organization unit: Faculty of Science
• UT WoS: 000172819600009
• Keywords in English: As-S chalcogenide films; Combined spectrophotometric method; Amorphous materials; Optical constants
• Tags: Amorphous materials, As-S chalcogenide films, Combined spectrophotometric method, optical constants
• Tags: International impact

Abstract

In this paper a combined spectrophotometric method is used to analyzed As-S chalcogenide thin films. This method is based on the simultaneous interpretation of experimental data corresponding to the reflectance from the ambient side, reflectance from the substrate side and transmittance of the chalcogenide films deposited onto the glass substrate. It is shown that this method is usable for the optical characterization of the chalcogenide films even when these films exhibit an inhomogeneity formed by a refractive index profile. Within this method our dispersion model of the optical constants of amorphous materials is used. This means that the values of the dispersion parameters determining the spectral dependences of the optical constants of the As-S chalcogenide material are evaluated. In the paper the advantages of the combined method mentioned are discussed from the practical point of view.

Links

• GA203/00/0085, research and development project: Name: Optické vlastnosti skel a amorfních tenkých vrstev sulfidů a selenidů

Investor: Czech Science Foundation, Optical properties of glasses and amorphous thin films of sulphides and selenides

• MSM 143100002, plan (intention): Name: Fyzikální vlastnosti nových materiálů a vrstevnatých struktur

Investor: Ministry of Education, Youth and Sports of the CR, Physical properties of new materials and layered structures