| FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Pavel POKORNÝ. Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 759-762. ISSN 0142-2421. |
Other formats:
BibTeX
LaTeX
RIS
@article{407667,
author = {Franta, Daniel and Ohlídal, Ivan and Klapetek, Petr and Pokorný, Pavel},
article_location = {USA},
article_number = {1},
keywords = {TiO2 thin films; optical characterization; AFM; boundary roughness},
language = {eng},
issn = {0142-2421},
journal = {Surface and Interface Analysis},
title = {Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods},
url = {http://hydra.physics.muni.cz/~franta/bib/SIA34_759.html},
volume = {34},
year = {2002}
}
TY - JOUR
ID - 407667
AU - Franta, Daniel - Ohlídal, Ivan - Klapetek, Petr - Pokorný, Pavel
PY - 2002
TI - Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods
JF - Surface and Interface Analysis
VL - 34
IS - 1
SP - 759-762
EP - 759-762
PB - John Wiley & Sons
SN - 01422421
KW - TiO2 thin films
KW - optical characterization
KW - AFM
KW - boundary roughness
UR - http://hydra.physics.muni.cz/~franta/bib/SIA34_759.html
N2 - In this paper slight roughness of the upper boundaries of TiO2 thin films prepared on substrates formed by single-crystal silicon is studied. Atomic force microscopy (AFM) and an optical method based on combining variable-angle spectroscopic ellipsometry and near-normal spectroscopic reflectometry are used for this purpose. It is shown that the values of the basic statistical quantities characterizing this roughness depend quite strongly on the values of the thicknesses of these films (they increase with increasing thickness). Differences observed between the values of the basic statistical parameters determined by AFM and the optical method are explained. It is also shown that the TiO2 films exhibit an inhomogeneity represented by a profile of the complex refractive index.
ER -
FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Pavel POKORNÝ. Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods. \textit{Surface and Interface Analysis}. USA: John Wiley \&{} Sons, 2002, vol.~34, No~1, p.~759-762. ISSN~0142-2421.
|
