LEE, Jay and David W. S. WONG. Statistical analysis with arcview GIS. New York: John Wiley & Sons, 2000, xi, 192. ISBN 0471348740. |
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Basic information | |
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Original name | Statistical analysis with arcview GIS |
Authors | LEE, Jay and David W. S. WONG. |
Edition | New York, xi, 192, 2000. |
Publisher | John Wiley & Sons |
Other information | |
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ISBN | 0471348740 |
Changed by | The record has been imported from the library system. Changed: 24/10/2022 04:46. |
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