| LEE, Jay and David W. S. WONG. Statistical analysis with arcview GIS. New York: John Wiley & Sons, 2000, xi, 192. ISBN 0471348740. |
|
Other formats:
BibTeX
LaTeX
RIS
|
| Basic information | |
|---|---|
| Original name | Statistical analysis with arcview GIS |
| Authors | LEE, Jay and David W. S. WONG. |
| Edition | New York, xi, 192, 2000. |
| Publisher | John Wiley & Sons |
| Other information | |
|---|---|
| ISBN | 0471348740 |
| Changed by | The record has been imported from the library system. Changed: 24/10/2022 04:46. |
PrintDisplayed: 8/9/2024 14:07