FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. Acta Physica Slovaca. Bratislava: Institute of Physics SAS, 2003, vol. 53, No 2, p. 95-104. ISSN 0323-0465. |
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@article{487588, author = {Franta, Daniel and Ohlídal, Ivan and Klapetek, Petr and MontaigneandRamil, Alberto and Bonanni, Alberta and Stifter, David and Sitter, Helmut}, article_location = {Bratislava}, article_number = {2}, keywords = {SPECTROSCOPIC ELLIPSOMETRY; MATRIX FORMALISM; CARBON-FILMS; MULTISAMPLE; GAAS}, language = {eng}, issn = {0323-0465}, journal = {Acta Physica Slovaca}, title = {Optical constants of ZnTe and ZnSe epitaxial thin films}, url = {http://hydra.physics.muni.cz/~franta/bib/APS53_95.html}, volume = {53}, year = {2003} }
TY - JOUR ID - 487588 AU - Franta, Daniel - Ohlídal, Ivan - Klapetek, Petr - Montaigne-Ramil, Alberto - Bonanni, Alberta - Stifter, David - Sitter, Helmut PY - 2003 TI - Optical constants of ZnTe and ZnSe epitaxial thin films JF - Acta Physica Slovaca VL - 53 IS - 2 SP - 95-104 EP - 95-104 PB - Institute of Physics SAS SN - 03230465 KW - SPECTROSCOPIC ELLIPSOMETRY KW - MATRIX FORMALISM KW - CARBON-FILMS KW - MULTISAMPLE KW - GAAS UR - http://hydra.physics.muni.cz/~franta/bib/APS53_95.html N2 - In this paper the spectral dependences of the optical constants, i.e. refractive index and extinction coefficient, are presented within the spectral region 220-850 nm. For determining these spectral dependences a multi-sample modification of the combined optical method based on a simultaneous interpretation of experimental data corresponding to variable angle spectro-scopic ellipsometry and near-normal spectroscopic reflectometry is used. Further, physical models and an iterative procedure enabling us to determine the spectral dependences of the optical constants of both the epitaxial films are described in detail. The spectral dependences of the optical constants are introduced in the forms of curves and tables. ER -
FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. \textit{Acta Physica Slovaca}. Bratislava: Institute of Physics SAS, 2003, vol.~53, No~2, p.~95-104. ISSN~0323-0465.
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