Optical constants of ZnTe and ZnSe epitaxial thin films

J 2003

Optical constants of ZnTe and ZnSe epitaxial thin films

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI et. al.

Basic information

Original name

Optical constants of ZnTe and ZnSe epitaxial thin films

Authors

FRANTA, Daniel (203 Czech Republic, guarantor), Ivan OHLÍDAL (203 Czech Republic), Petr KLAPETEK (203 Czech Republic), Alberto MONTAIGNE-RAMIL (192 Cuba), Alberta BONANNI (380 Italy), David STIFTER (40 Austria) and Helmut SITTER (40 Austria)

Edition

Acta Physica Slovaca, Bratislava, Institute of Physics SAS, 2003, 0323-0465

Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10302 Condensed matter physics

Country of publisher

Slovakia

Confidentiality degree

není předmětem státního či obchodního tajemství

References:

URL

Impact factor

Impact factor: 0.579

RIV identification code

RIV/00216224:14310/03:00008102

Organization unit

Faculty of Science

UT WoS

000182451100002

Keywords in English

SPECTROSCOPIC ELLIPSOMETRY; MATRIX FORMALISM; CARBON-FILMS; MULTISAMPLE; GAAS

Abstract

V originále

In this paper the spectral dependences of the optical constants, i.e. refractive index and extinction coefficient, are presented within the spectral region 220-850 nm. For determining these spectral dependences a multi-sample modification of the combined optical method based on a simultaneous interpretation of experimental data corresponding to variable angle spectro-scopic ellipsometry and near-normal spectroscopic reflectometry is used. Further, physical models and an iterative procedure enabling us to determine the spectral dependences of the optical constants of both the epitaxial films are described in detail. The spectral dependences of the optical constants are introduced in the forms of curves and tables.

Links

GA202/01/1110, research and development project

Name: Optické a mechanické vlastnosti tenkých vrstev DLC:Si připravených PECVD metodou

Investor: Czech Science Foundation, Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method

Citovat

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. Acta Physica Slovaca. Bratislava: Institute of Physics SAS, 2003, vol. 53, No 2, p. 95-104. ISSN 0323-0465.

@article{487588,
   author = {Franta, Daniel and Ohlídal, Ivan and Klapetek, Petr and MontaigneandRamil, Alberto and Bonanni, Alberta and Stifter, David and Sitter, Helmut},
   article_location = {Bratislava},
   article_number = {2},
   keywords = {SPECTROSCOPIC ELLIPSOMETRY; MATRIX FORMALISM; CARBON-FILMS; MULTISAMPLE; GAAS},
   language = {eng},
   issn = {0323-0465},
   journal = {Acta Physica Slovaca},
   title = {Optical constants of ZnTe and ZnSe epitaxial thin films},
   url = {http://hydra.physics.muni.cz/~franta/bib/APS53_95.html},
   volume = {53},
   year = {2003}
}

TY  - JOUR
ID  - 487588
AU  - Franta, Daniel - Ohlídal, Ivan - Klapetek, Petr - Montaigne-Ramil, Alberto - Bonanni, Alberta - Stifter, David - Sitter, Helmut
PY  - 2003
TI  - Optical constants of ZnTe and ZnSe epitaxial thin films
JF  - Acta Physica Slovaca
VL  - 53
IS  - 2
SP  - 95-104
EP  - 95-104
PB  - Institute of Physics SAS
SN  - 03230465
KW  - SPECTROSCOPIC ELLIPSOMETRY
KW  - MATRIX FORMALISM
KW  - CARBON-FILMS
KW  - MULTISAMPLE
KW  - GAAS
UR  - http://hydra.physics.muni.cz/~franta/bib/APS53_95.html
N2  - In this paper the spectral dependences of the optical constants, i.e. refractive index and extinction coefficient, are presented within the spectral region 220-850 nm. For determining these spectral dependences a multi-sample modification of the combined optical method based on a simultaneous interpretation of experimental data corresponding to variable angle spectro-scopic ellipsometry and near-normal spectroscopic reflectometry is used. Further, physical models and an iterative procedure enabling us to determine the spectral dependences of the optical constants of both the epitaxial films are described in detail. The spectral dependences of the optical constants are introduced in the forms of curves and tables.
ER  -

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. \textit{Acta Physica Slovaca}. Bratislava: Institute of Physics SAS, 2003, vol.~53, No~2, p.~95-104. ISSN~0323-0465.

Detailed Information on Publication Record