KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, vol. 53, No 3, p. 223-230. ISSN 0323-0465.
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Basic information
Original name Atomic force microscopy characterization of ZnTe epitaxial films
Authors KLAPETEK, Petr (203 Czech Republic), Ivan OHLÍDAL (203 Czech Republic, guarantor), Daniel FRANTA (203 Czech Republic), Alberto MONTAIGNE-RAMIL (192 Cuba), Alberta BONANNI (380 Italy), David STIFTER (40 Austria) and Helmut SITTER (40 Austria).
Edition Acta Physica Slovaca, Bratislava, Institute of Physics, SAS, 2003, 0323-0465.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher Slovakia
Confidentiality degree is not subject to a state or trade secret
WWW URL
Impact factor Impact factor: 0.579
RIV identification code RIV/00216224:14310/03:00009017
Organization unit Faculty of Science
UT WoS 000183309100005
Keywords in English OPTICAL METHODS; THIN-FILMS; GOLD
Tags gold, optical methods, THIN-FILMS
Changed by Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 01:17.
Abstract
In this paper results of a characterization of the surfaces of ZnTe epitaxial thin films exhibiting the different thicknesses are presented. The results mentioned are obtained using the procedures enabling us to determine the values of the following quantities: mean grain size, grain size distribution, root-mean square values of the heights of the irregularities and the diagram describing the distribution of the directions of the normals. For the analysis of the grain structure a watershed algorithm is used. It is shown that the values of these quantities can describe the morphology of the ZnTe film surfaces in a sufficient way. Further, it is shown that the structure of the surfaces of the ZnTe films exhibit facets forming a grain structure. Moreover, it is presented that the ZnTe film surfaces exhibit a strong slope anisotropy and that the linear dimensions of the grains increase with increasing values of the thicknesses of the ZnTe films.
Links
MSM 143100003, plan (intention)Name: Studium plazmochemických reakcí v neizotermickém nízkoteplotním plazmatu a jeho interakcí s povrchem pevných látek
Investor: Ministry of Education, Youth and Sports of the CR, Study of plasmachemical reactions in non-isothermic low pressure plasma and its interaction with the surface of solid substrates
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