KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, vol. 53, No 3, p. 223-230. ISSN 0323-0465. |
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@article{489711, author = {Klapetek, Petr and Ohlídal, Ivan and Franta, Daniel and MontaigneandRamil, Alberto and Bonanni, Alberta and Stifter, David and Sitter, Helmut}, article_location = {Bratislava}, article_number = {3}, keywords = {OPTICAL METHODS; THIN-FILMS; GOLD}, language = {eng}, issn = {0323-0465}, journal = {Acta Physica Slovaca}, title = {Atomic force microscopy characterization of ZnTe epitaxial films}, url = {http://hydra.physics.muni.cz/~franta/bib/APS53_223.html}, volume = {53}, year = {2003} }
TY - JOUR ID - 489711 AU - Klapetek, Petr - Ohlídal, Ivan - Franta, Daniel - Montaigne-Ramil, Alberto - Bonanni, Alberta - Stifter, David - Sitter, Helmut PY - 2003 TI - Atomic force microscopy characterization of ZnTe epitaxial films JF - Acta Physica Slovaca VL - 53 IS - 3 SP - 223-230 EP - 223-230 PB - Institute of Physics, SAS SN - 03230465 KW - OPTICAL METHODS KW - THIN-FILMS KW - GOLD UR - http://hydra.physics.muni.cz/~franta/bib/APS53_223.html N2 - In this paper results of a characterization of the surfaces of ZnTe epitaxial thin films exhibiting the different thicknesses are presented. The results mentioned are obtained using the procedures enabling us to determine the values of the following quantities: mean grain size, grain size distribution, root-mean square values of the heights of the irregularities and the diagram describing the distribution of the directions of the normals. For the analysis of the grain structure a watershed algorithm is used. It is shown that the values of these quantities can describe the morphology of the ZnTe film surfaces in a sufficient way. Further, it is shown that the structure of the surfaces of the ZnTe films exhibit facets forming a grain structure. Moreover, it is presented that the ZnTe film surfaces exhibit a strong slope anisotropy and that the linear dimensions of the grains increase with increasing values of the thicknesses of the ZnTe films. ER -
KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. \textit{Acta Physica Slovaca}. Bratislava: Institute of Physics, SAS, 2003, vol.~53, No~3, p.~223-230. ISSN~0323-0465.
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