Atomic force microscopy characterization of ZnTe epitaxial
films

J 2003

Atomic force microscopy characterization of ZnTe epitaxial films

KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI et. al.

Basic information

Original name

Atomic force microscopy characterization of ZnTe epitaxial films

Authors

KLAPETEK, Petr (203 Czech Republic), Ivan OHLÍDAL (203 Czech Republic, guarantor), Daniel FRANTA (203 Czech Republic), Alberto MONTAIGNE-RAMIL (192 Cuba), Alberta BONANNI (380 Italy), David STIFTER (40 Austria) and Helmut SITTER (40 Austria)

Edition

Acta Physica Slovaca, Bratislava, Institute of Physics, SAS, 2003, 0323-0465

Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10302 Condensed matter physics

Country of publisher

Slovakia

Confidentiality degree

není předmětem státního či obchodního tajemství

References:

URL

Impact factor

Impact factor: 0.579

RIV identification code

RIV/00216224:14310/03:00009017

Organization unit

Faculty of Science

UT WoS

000183309100005

Keywords in English

OPTICAL METHODS; THIN-FILMS; GOLD

Abstract

V originále

In this paper results of a characterization of the surfaces of ZnTe epitaxial thin films exhibiting the different thicknesses are presented. The results mentioned are obtained using the procedures enabling us to determine the values of the following quantities: mean grain size, grain size distribution, root-mean square values of the heights of the irregularities and the diagram describing the distribution of the directions of the normals. For the analysis of the grain structure a watershed algorithm is used. It is shown that the values of these quantities can describe the morphology of the ZnTe film surfaces in a sufficient way. Further, it is shown that the structure of the surfaces of the ZnTe films exhibit facets forming a grain structure. Moreover, it is presented that the ZnTe film surfaces exhibit a strong slope anisotropy and that the linear dimensions of the grains increase with increasing values of the thicknesses of the ZnTe films.

Links

MSM 143100003, plan (intention)

Name: Studium plazmochemických reakcí v neizotermickém nízkoteplotním plazmatu a jeho interakcí s povrchem pevných látek

Investor: Ministry of Education, Youth and Sports of the CR, Study of plasmachemical reactions in non-isothermic low pressure plasma and its interaction with the surface of solid substrates

Citovat

KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, vol. 53, No 3, p. 223-230. ISSN 0323-0465.

@article{489711,
   author = {Klapetek, Petr and Ohlídal, Ivan and Franta, Daniel and MontaigneandRamil, Alberto and Bonanni, Alberta and Stifter, David and Sitter, Helmut},
   article_location = {Bratislava},
   article_number = {3},
   keywords = {OPTICAL METHODS; THIN-FILMS; GOLD},
   language = {eng},
   issn = {0323-0465},
   journal = {Acta Physica Slovaca},
   title = {Atomic force microscopy characterization of ZnTe epitaxial films},
   url = {http://hydra.physics.muni.cz/~franta/bib/APS53_223.html},
   volume = {53},
   year = {2003}
}

TY  - JOUR
ID  - 489711
AU  - Klapetek, Petr - Ohlídal, Ivan - Franta, Daniel - Montaigne-Ramil, Alberto - Bonanni, Alberta - Stifter, David - Sitter, Helmut
PY  - 2003
TI  - Atomic force microscopy characterization of ZnTe epitaxial films
JF  - Acta Physica Slovaca
VL  - 53
IS  - 3
SP  - 223-230
EP  - 223-230
PB  - Institute of Physics, SAS
SN  - 03230465
KW  - OPTICAL METHODS
KW  - THIN-FILMS
KW  - GOLD
UR  - http://hydra.physics.muni.cz/~franta/bib/APS53_223.html
N2  - In this paper results of a characterization of the surfaces of ZnTe epitaxial thin films exhibiting the different thicknesses are presented. The results mentioned are obtained using the procedures enabling us to determine the values of the following quantities: mean grain size, grain size distribution, root-mean square values of the heights of the irregularities and the diagram describing the distribution of the directions of the normals. For the analysis of the grain structure a watershed algorithm is used. It is shown that the values of these quantities can describe the morphology of the ZnTe film surfaces in a sufficient way. Further, it is shown that the structure of the surfaces of the ZnTe films exhibit facets forming a grain structure. Moreover, it is presented that the ZnTe film surfaces exhibit a strong slope anisotropy and that the linear dimensions of the grains increase with increasing values of the thicknesses of the ZnTe films.
ER  -

KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. \textit{Acta Physica Slovaca}. Bratislava: Institute of Physics, SAS, 2003, vol.~53, No~3, p.~223-230. ISSN~0323-0465.

Detailed Information on Publication Record