KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial thin films. Japanese Journal of Applied Physics. Tokyo: Institute of Pure and Applied Physics, roč. 42, 7B, s. 4706-4709, 5 s. ISSN 0021-4922. 2003. |
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@article{490021, author = {Klapetek, Petr and Ohlídal, Ivan and MontaigneandRamil, Alberto and Bonanni, Alberta and Stifter, David and Sitter, Helmut}, article_location = {Tokyo}, article_number = {7B}, keywords = {ZnTe epitaxial films; AFM analysis; faceted boundaries}, language = {eng}, issn = {0021-4922}, journal = {Japanese Journal of Applied Physics}, title = {Atomic force microscopy characterization of ZnTe epitaxial thin films}, volume = {42}, year = {2003} }
TY - JOUR ID - 490021 AU - Klapetek, Petr - Ohlídal, Ivan - Montaigne-Ramil, Alberto - Bonanni, Alberta - Stifter, David - Sitter, Helmut PY - 2003 TI - Atomic force microscopy characterization of ZnTe epitaxial thin films JF - Japanese Journal of Applied Physics VL - 42 IS - 7B SP - 4706-4709 EP - 4706-4709 PB - Institute of Pure and Applied Physics SN - 00214922 KW - ZnTe epitaxial films KW - AFM analysis KW - faceted boundaries N2 - In this paper, results concerning atomic force microscopy studies of the upper bounaries of ZnTe epitaxial thin films prepared by molecular beam epitaxy onto gallium arsenide single crystal substrates are presented. It is sohw that the upper boundaries exhibit faceted structure which is described by means of statistical analysis. ER -
KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial thin films. \textit{Japanese Journal of Applied Physics}. Tokyo: Institute of Pure and Applied Physics, roč.~42, 7B, s.~4706-4709, 5 s. ISSN~0021-4922. 2003.
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