J
2003
Effect of overgrowth temperature on shape, strain, and composition of buried Ge islands deduced from x-ray diffraction
HOLÝ, Václav
Basic information
Original name
Effect of overgrowth temperature on shape, strain, and composition of buried Ge islands deduced from x-ray diffraction
Edition
Applied Physics Letters, USA, American Institute of Physics, 2003, 0003-6951
Other information
Type of outcome
Článek v odborném periodiku
Field of Study
10302 Condensed matter physics
Country of publisher
United States of America
Confidentiality degree
není předmětem státního či obchodního tajemství
Impact factor
Impact factor: 4.049
RIV identification code
RIV/00216224:14310/03:00008491
Organization unit
Faculty of Science
Keywords in English
Effect of overgrowth temperature on shape; strain; and composition of buried Ge islands deduced from x-ray diffraction
V originále
Effect of overgrowth temperature on shape, strain, and composition of buried Ge islands deduced from x-ray diffraction
Links
GA202/03/0148, research and development project | Name: Anomální rozptyl rtg záření na polovodičových nanostrukturách | Investor: Czech Science Foundation, Anomalous x-ray scattering from semiconductor nanostructures |
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MSM 143100002, plan (intention) | Name: Fyzikální vlastnosti nových materiálů a vrstevnatých struktur | Investor: Ministry of Education, Youth and Sports of the CR, Physical properties of new materials and layered structures |
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Displayed: 2/11/2024 03:49