Scanning electron microscopy and X-ray microanalysis
GOLDSTEIN, Joseph I. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer Academic/Plenum publishers, 2003, xix, 689 s. ISBN 0-306-47292-9. |
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Basic information | |
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Original name | Scanning electron microscopy and X-ray microanalysis |
Authors | GOLDSTEIN, Joseph I. |
Edition | 3rd ed. New York, xix, 689 s, 2003. |
Publisher | Kluwer Academic/Plenum publishers |
Other information | |
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ISBN | 0-306-47292-9 |
Changed by | The record has been imported from the library system. Changed: 3/12/2009 00:00. |
PrintDisplayed: 27/4/2024 03:05