GOLDSTEIN, Joseph I. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer Academic/Plenum publishers, 2003, xix, 689 s. ISBN 0-306-47292-9.
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Basic information
Original name Scanning electron microscopy and X-ray microanalysis
Authors GOLDSTEIN, Joseph I.
Edition 3rd ed. New York, xix, 689 s, 2003.
Publisher Kluwer Academic/Plenum publishers
Other information
ISBN 0-306-47292-9
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