2004
Diffraction effects in infrared ellipsometry of conducting samples
HUMLÍČEK, Josef and Christian BERNHARDBasic information
Original name
Diffraction effects in infrared ellipsometry of conducting samples
Name in Czech
Difrakční efekty v infračervené elipsometrii vodivých vzorků
Authors
HUMLÍČEK, Josef (203 Czech Republic, guarantor) and Christian BERNHARD (276 Germany)
Edition
Thin Solid Films, Oxford, Elsevier, 2004, 0040-6090
Other information
Language
English
Type of outcome
Article in a journal
Field of Study
10302 Condensed matter physics
Country of publisher
United Kingdom of Great Britain and Northern Ireland
Confidentiality degree
is not subject to a state or trade secret
Impact factor
Impact factor: 1.647
RIV identification code
RIV/00216224:14310/04:00021209
Organization unit
Faculty of Science
UT WoS
000221690000030
Keywords in English
Infrared ellipsometry; Diffraction; Metals
Tags
International impact, Reviewed
Changed: 9/2/2007 14:21, prof. RNDr. Josef Humlíček, CSc.
V originále
We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper.
In Czech
We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper.
Links
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