Detailed Information on Publication Record
2004
Diffraction effects in infrared ellipsometry of conducting samples
HUMLÍČEK, Josef and Christian BERNHARDBasic information
Original name
Diffraction effects in infrared ellipsometry of conducting samples
Name in Czech
Difrakční efekty v infračervené elipsometrii vodivých vzorků
Authors
HUMLÍČEK, Josef (203 Czech Republic, guarantor) and Christian BERNHARD (276 Germany)
Edition
Thin Solid Films, Oxford, Elsevier, 2004, 0040-6090
Other information
Language
English
Type of outcome
Článek v odborném periodiku
Field of Study
10302 Condensed matter physics
Country of publisher
United Kingdom of Great Britain and Northern Ireland
Confidentiality degree
není předmětem státního či obchodního tajemství
Impact factor
Impact factor: 1.647
RIV identification code
RIV/00216224:14310/04:00021209
Organization unit
Faculty of Science
UT WoS
000221690000030
Keywords in English
Infrared ellipsometry; Diffraction; Metals
Tags
International impact, Reviewed
Změněno: 9/2/2007 14:21, prof. RNDr. Josef Humlíček, CSc.
V originále
We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper.
In Czech
We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper.
Links
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