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@article{555296, author = {Humlíček, Josef and Bernhard, Christian}, article_location = {Oxford}, article_number = {1}, keywords = {Infrared ellipsometry; Diffraction; Metals}, language = {eng}, issn = {0040-6090}, journal = {Thin Solid Films}, title = {Diffraction effects in infrared ellipsometry of conducting samples}, volume = {455-456}, year = {2004} }
TY - JOUR ID - 555296 AU - Humlíček, Josef - Bernhard, Christian PY - 2004 TI - Diffraction effects in infrared ellipsometry of conducting samples JF - Thin Solid Films VL - 455-456 IS - 1 SP - 177-182 EP - 177-182 PB - Elsevier SN - 00406090 KW - Infrared ellipsometry KW - Diffraction KW - Metals N2 - We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper. ER -
HUMLÍČEK, Josef and Christian BERNHARD. Diffraction effects in infrared ellipsometry of conducting samples. \textit{Thin Solid Films}. Oxford: Elsevier, 2004, 455-456, No~1, p.~177-182. ISSN~0040-6090.
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