| BONAVENTUROVÁ ZRZAVECKÁ, Olga, Alois NEBOJSA, Karel NAVRÁTIL, Stanislav NEŠPŮREK and Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane). Thin Solid Films. Elsevier, 2004, 455/2004, may, p. 278-282. ISSN 0040-6090. |
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@article{555504,
author = {Bonaventurová Zrzavecká, Olga and Nebojsa, Alois and Navrátil, Karel and Nešpůrek, Stanislav and Humlíček, Josef},
article_number = {may},
keywords = {temperature; ellipsometric spectra; poly(methyl-phenylsilane);},
language = {eng},
issn = {0040-6090},
journal = {Thin Solid Films},
title = {Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)},
volume = {455/2004},
year = {2004}
}
TY - JOUR
ID - 555504
AU - Bonaventurová Zrzavecká, Olga - Nebojsa, Alois - Navrátil, Karel - Nešpůrek, Stanislav - Humlíček, Josef
PY - 2004
TI - Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)
JF - Thin Solid Films
VL - 455/2004
IS - may
SP - 278-282
EP - 278-282
PB - Elsevier
SN - 00406090
KW - temperature
KW - ellipsometric spectra
KW - poly(methyl-phenylsilane);
N2 - Comprehensive study of the temperature dependence of ultraviolet-visible ellipsometric spectra of thin films of poly(methyl-phenylsilane). It was found the threshold of irreversible changes of its optical response at 373 K and furthermore the average temperature shift of the lowest excitonic band in the reversible regime.The effect of annealing below and above 373 is studied with low- a high-level of the exposure to UV light.
ER -
BONAVENTUROVÁ ZRZAVECKÁ, Olga, Alois NEBOJSA, Karel NAVRÁTIL, Stanislav NEŠPŮREK and Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane). \textit{Thin Solid Films}. Elsevier, 2004, 455/2004, may, p.~278-282. ISSN~0040-6090.
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