BONAVENTUROVÁ ZRZAVECKÁ, Olga, Alois NEBOJSA, Karel NAVRÁTIL, Stanislav NEŠPŮREK and Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane). Thin Solid Films. Elsevier, 2004, 455/2004, may, p. 278-282. ISSN 0040-6090. |
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@article{555504, author = {Bonaventurová Zrzavecká, Olga and Nebojsa, Alois and Navrátil, Karel and Nešpůrek, Stanislav and Humlíček, Josef}, article_number = {may}, keywords = {temperature; ellipsometric spectra; poly(methyl-phenylsilane);}, language = {eng}, issn = {0040-6090}, journal = {Thin Solid Films}, title = {Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)}, volume = {455/2004}, year = {2004} }
TY - JOUR ID - 555504 AU - Bonaventurová Zrzavecká, Olga - Nebojsa, Alois - Navrátil, Karel - Nešpůrek, Stanislav - Humlíček, Josef PY - 2004 TI - Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane) JF - Thin Solid Films VL - 455/2004 IS - may SP - 278-282 EP - 278-282 PB - Elsevier SN - 00406090 KW - temperature KW - ellipsometric spectra KW - poly(methyl-phenylsilane); N2 - Comprehensive study of the temperature dependence of ultraviolet-visible ellipsometric spectra of thin films of poly(methyl-phenylsilane). It was found the threshold of irreversible changes of its optical response at 373 K and furthermore the average temperature shift of the lowest excitonic band in the reversible regime.The effect of annealing below and above 373 is studied with low- a high-level of the exposure to UV light. ER -
BONAVENTUROVÁ ZRZAVECKÁ, Olga, Alois NEBOJSA, Karel NAVRÁTIL, Stanislav NEŠPŮREK and Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane). \textit{Thin Solid Films}. Elsevier, 2004, 455/2004, may, p.~278-282. ISSN~0040-6090.
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