HARTMANOVÁ, Marie, Vladislav NAVRÁTIL, Karel NAVRÁTIL, Marian JERGEL, Kateřina GMUCOVA, Fjod Alexandrovič GANDARILLA, Jan ZEMEK, Sergej CHROMIK and František KUNDRACIK. Correlation between microscopic and macroscopic properties of yttria-stabilized zirconia thin films. In Physics and Technology of Thin Films IWTF 2003. I. Teheran, Iran: World Scientific, 2004, p. 158-168.
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Basic information
Original name Correlation between microscopic and macroscopic properties of yttria-stabilized zirconia thin films
Name in Czech Vztah mezi mikroskopickými a makroskopickými vlastnostmi yttriem stabilizovaných tenkých zirkoniových vrstev
Authors HARTMANOVÁ, Marie (703 Slovakia), Vladislav NAVRÁTIL (203 Czech Republic, guarantor), Karel NAVRÁTIL (203 Czech Republic), Marian JERGEL (484 Mexico), Kateřina GMUCOVA (703 Slovakia), Fjod Alexandrovič GANDARILLA (484 Mexico), Jan ZEMEK (203 Czech Republic), Sergej CHROMIK (703 Slovakia) and František KUNDRACIK (703 Slovakia).
Edition I. Teheran, Iran, Physics and Technology of Thin Films IWTF 2003, p. 158-168, 11 pp. 2004.
Publisher World Scientific
Other information
Original language English
Type of outcome Proceedings paper
Field of Study 10302 Condensed matter physics
Country of publisher Islamic Republic of Iran
Confidentiality degree is not subject to a state or trade secret
Organization unit Faculty of Education
UT WoS 000223358300010
Keywords in English yttria stabilized zirconia; thin films; microhardness; structure; electrical conductivity.
Tags electrical conductivity., Microhardness, structure, thin films, yttria stabilized zirconia
Changed by Changed by: prof. RNDr. Vladislav Navrátil, CSc., učo 129. Changed: 24/10/2008 14:11.
Abstract
The physical (optical, mechanical and electrical) parameters of yttria stabilized thin zirconia films are presented. The dependence of these parameters on technology is also studied.
Abstract (in Czech)
V příspěvku jsou uvedeny nejvýznamnější optické, mechanické a elektrické vlastnosti yttriem stabilizovaných zirkoniových tenkých vrstev. Tyto vlastnosti jsou studovány v závislosti na technologii přípravy vrstev.
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