| KÖHLER, B., J. SCHREIBER, B. BENDJUS, M. HERMS, V. MELOV, L. HELFEN, Petr MIKULÍK and T. BAUMBACH. Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance. Proceedings of SPIE: Testing, Reliability, and Application of Micro- and Nano-Material Systems II. USA: SPIE, 2004, vol. 5392, No 1, p. 63-77. ISSN 0-8194-5309-9. |
Other formats:
BibTeX
LaTeX
RIS
@article{561247,
author = {Köhler, B. and Schreiber, J. and Bendjus, B. and Herms, M. and Melov, V. and Helfen, L. and Mikulík, Petr and Baumbach, T.},
article_location = {USA},
article_number = {1},
keywords = {NDE; NDT; materials; X-ray; SEM; SEAM; SPM},
language = {eng},
issn = {0-8194-5309-9},
journal = {Proceedings of SPIE: Testing, Reliability, and Application of Micro- and Nano-Material Systems II},
title = {Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance},
url = {http://www.sci.muni.cz/~mikulik/Publications.html#KohlerSchreiberBendjus-SPIE-2004},
volume = {5392},
year = {2004}
}
TY - JOUR
ID - 561247
AU - Köhler, B. - Schreiber, J. - Bendjus, B. - Herms, M. - Melov, V. - Helfen, L. - Mikulík, Petr - Baumbach, T.
PY - 2004
TI - Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance
JF - Proceedings of SPIE: Testing, Reliability, and Application of Micro- and Nano-Material Systems II
VL - 5392
IS - 1
SP - 63-77
EP - 63-77
PB - SPIE
SN - 0819453099
KW - NDE
KW - NDT
KW - materials
KW - X-ray
KW - SEM
KW - SEAM
KW - SPM
UR - http://www.sci.muni.cz/~mikulik/Publications.html#KohlerSchreiberBendjus-SPIE-2004
N2 - NDE activities at the Laboratory for Acoustic Diagnosis and Quality Assurance (EADQ) Dresden are outlined. The applied methods comprise acoustic, thermal, optical and X-ray ones. Additionally, scanning probe methods (SPM) and scanning electron microscopy (SEM) are used. Combinations of different methods are especially effective. This is demonstrated for the coupling of an acoustic approach with SEM. For NDE on a micro- and nano-meter scale, preparation of appropriate test flaws and the verification of the NDE results turn out to be a challenge. To meet this challenge, we propose an approach based on focused ion beam technique.
ER -
KÖHLER, B., J. SCHREIBER, B. BENDJUS, M. HERMS, V. MELOV, L. HELFEN, Petr MIKULÍK and T. BAUMBACH. Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance. \textit{Proceedings of SPIE: Testing, Reliability, and Application of Micro- and Nano-Material Systems II}. USA: SPIE, 2004, vol.~5392, No~1, p.~63-77. ISSN~0-8194-5309-9.
|
