BRZOBOHATÝ, Oto, Vilma BURŠÍKOVÁ and David TRUNEC. Monte Carlo and Particle in Cell Simulation of Mirror Effect in PECVD reactor. In WDS'04 Proceedings of Contributed Papers, Part II. Prague, (Czech republic): MATFYZPRESS, 2004, p. 287-292. ISBN 80-86732-32-0.
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Basic information
Original name Monte Carlo and Particle in Cell Simulation of Mirror Effect in PECVD reactor
Name in Czech Monte Carlo a Particle in Cell simulace zrcadlového jevu v PECVD reaktoru
Authors BRZOBOHATÝ, Oto (203 Czech Republic), Vilma BURŠÍKOVÁ (203 Czech Republic) and David TRUNEC (203 Czech Republic, guarantor).
Edition Prague, (Czech republic), WDS'04 Proceedings of Contributed Papers, Part II, p. 287-292, 6 pp. 2004.
Publisher MATFYZPRESS
Other information
Original language English
Type of outcome Proceedings paper
Field of Study 10305 Fluids and plasma physics
Country of publisher Czech Republic
Confidentiality degree is not subject to a state or trade secret
RIV identification code RIV/00216224:14310/04:00011745
Organization unit Faculty of Science
ISBN 80-86732-32-0
Keywords in English Computer simulation; PECVD; Mirror effect
Tags computer simulation, Mirror effect, PECVD
Changed by Changed by: Mgr. Oto Brzobohatý, Ph.D., učo 15554. Changed: 30/11/2005 10:34.
Abstract
We have studied thin film plasma enhanced chemical vapor deposition from methane and thin film sputtering in argon in low pressure rf discharge. We have observed that thickness of a thin film deposited on the upper (grounded) electrode has mirrored substrates placed on the bottom rf powered electrode. This mirror images have not been quite sharp. The same effect was observed when the initially homogeneous film (deposited on the upper electrode) was sputtered in the argon plasma. Again the image of object on the bottom electrode was sputtered in the film on the upper electrode. The mirror effect has been studied via Particle In Cell - Monte Carlo (PIC-MC) computer simulation. In our explanation the mirror effect is caused by the difference between secondary electron emission coefficient of substrate material and material of substrate holder. This difference in the secondary electron emission coefficient affects plasma density upon the substrates and this leads to higher or lower deposition rate on the upper electrode. In our simulation we have calculated distribution of impact position for electrons on grounded electrode which have flew from the powered electrode. We have calculated this distribution for ions created in ionization collisions (of secondary electrons with neutrals) too. We have carried out simulation of this distribution for different pressures.
Abstract (in Czech)
Při studiu depozice tenkých vrstev pomocí metody PECVD byl pozorován tzv. zrcadlový jev. Zrcadlovým jevem myslíme to, že deponovaná vrstva na vrchní elektrodě odráží substrat na spodní elektrodě. Hrany obrazu nejsou zcela ostré. Tento jev jsem se snažili vzsvětli pomocí počitačových simulací, kde jako hlavní příčinu označujeme rozdílnost sekundární emise substrátů a dolní elektrody. Jako hlavní výsledek naších simulací uvádíme prostorové rozděleni sekundárních elektronů a iontů dopadajících na protější elektrodu.
Links
GA202/03/0827, research and development projectName: Studium elementárních procesů v nízkoteplotním a technologicky orientovaném plazmatu a vývoj relevantních diagnostických metod
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