FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical properties of ZnTe films prepared by molecular beam epitaxy. Thin Solid Films. Oxford, UK: Elsevier, 2004, vol. 468, 1-2, p. 193-202. ISSN 0040-6090. |
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@article{562879, author = {Franta, Daniel and Ohlídal, Ivan and Klapetek, Petr and MontaigneandRamil, Alberto and Bonanni, Alberta and Stifter, David and Sitter, Helmut}, article_location = {Oxford, UK}, article_number = {1-2}, keywords = {THIN-FILMS; ROUGH BOUNDARIES; SUBSTRATE; GAAS; DEPENDENCE; CONSTANTS}, language = {eng}, issn = {0040-6090}, journal = {Thin Solid Films}, title = {Optical properties of ZnTe films prepared by molecular beam epitaxy}, url = {http://hydra.physics.muni.cz/~franta/bib/TSF468_193.html}, volume = {468}, year = {2004} }
TY - JOUR ID - 562879 AU - Franta, Daniel - Ohlídal, Ivan - Klapetek, Petr - Montaigne-Ramil, Alberto - Bonanni, Alberta - Stifter, David - Sitter, Helmut PY - 2004 TI - Optical properties of ZnTe films prepared by molecular beam epitaxy JF - Thin Solid Films VL - 468 IS - 1-2 SP - 193-202 EP - 193-202 PB - Elsevier SN - 00406090 KW - THIN-FILMS KW - ROUGH BOUNDARIES KW - SUBSTRATE KW - GAAS KW - DEPENDENCE KW - CONSTANTS UR - http://hydra.physics.muni.cz/~franta/bib/TSF468_193.html N2 - In this paper, the optical properties of ZnTe epitaxial thin films prepared by molecular beam epitaxy (MBE) onto GaAs single crystal substrates are studied using the combined optical method employing a simultaneous interpretation of experimental data obtained by means of variable angle spectroscopic ellipsometry (VASE) and near-normal spectroscopic rellectometry (NNSR). The spectral dependences of both the optical constants, i.e. the refractive index and extinction coefficient, characterizing these films are presented within the spectral region 230-850 nm. It is shown that the optical properties of the ZnTe epitaxial films depend on the values of their thickness. This conclusion was found using the model of the optical constants exhibiting a profile across these films. A roughness of the upper boundaries of the ZnTe films and the existence of a very thin native oxide layer (NOL) on these boundaries are taken into account within the optical analysis. ER -
FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical properties of ZnTe films prepared by molecular beam epitaxy. \textit{Thin Solid Films}. Oxford, UK: Elsevier, 2004, vol.~468, 1-2, p.~193-202. ISSN~0040-6090.
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