ANDREEV, A., R. RESEL, M.D. SMILGIES, H. HOPPE, G. MATT, H. SITTER, N. S. SARICIFTCI, D. MEISSNER, H. PLANK and O. ZRZAVECKA. Oriented organic semiconductor thin films. Synthetic Metals. Elsevier, 2003, 138/2003, 1-2, p. 59-63. ISSN 0379-6779. |
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@article{567120, author = {Andreev, A. and Resel, R. and Smilgies, M.D. and Hoppe, H. and Matt, G. and Sitter, H. and Sariciftci, N. S. and Meissner, D. and Plank, H. and Zrzavecka, O.}, article_number = {1-2}, keywords = {Organic epitaxy; Crystalline thin films; Atomic force microscopy; X-ray diffraction}, language = {eng}, issn = {0379-6779}, journal = {Synthetic Metals}, title = {Oriented organic semiconductor thin films}, volume = {138/2003}, year = {2003} }
TY - JOUR ID - 567120 AU - Andreev, A. - Resel, R. - Smilgies, M.D. - Hoppe, H. - Matt, G. - Sitter, H. - Sariciftci, N. S. - Meissner, D. - Plank, H. - Zrzavecka, O. PY - 2003 TI - Oriented organic semiconductor thin films JF - Synthetic Metals VL - 138/2003 IS - 1-2 SP - 59-63 EP - 59-63 PB - Elsevier SN - 03796779 KW - Organic epitaxy KW - Crystalline thin films KW - Atomic force microscopy KW - X-ray diffraction N2 - In this part of our investigations, we mainly use atomic force microscopy to study the growth of para-sexiphenyl (PSP) films on mica. It is shown that self-organization of PSP molecules occurs during the deposition controlled by the substrate temperature and deposition time. In addition, X-ray diffraction (XRD) measurements were performed using synchrotron radiation. They confirmed the very high crystalline quality of the grown films. ER -
ANDREEV, A., R. RESEL, M.D. SMILGIES, H. HOPPE, G. MATT, H. SITTER, N. S. SARICIFTCI, D. MEISSNER, H. PLANK and O. ZRZAVECKA. Oriented organic semiconductor thin films. \textit{Synthetic Metals}. Elsevier, 2003, 138/2003, 1-2, p.~59-63. ISSN~0379-6779.
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