HARTMANNOVÁ, Mária, Martin JERGEL, Vladislav NAVRÁTIL, Karel NAVRÁTIL, Katarina GMUCOVÁ, F.C. GANDARILLA, Jan ZEMEK, Stefan CHROMIK and Frantiaek KUNDRACIK. Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets. In Acta Physica Slovaca. I. Bratislava: Institute of Physics, SAS, Bratislava, Slovakia, 2005, p. 247-259. ISBN 5-94691-216-X. |
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@inproceedings{573078, author = {Hartmannová, Mária and Jergel, Martin and Navrátil, Vladislav and Navrátil, Karel and Gmucová, Katarina and Gandarilla, F.C. and Zemek, Jan and Chromik, Stefan and Kundracik, Frantiaek}, address = {Bratislava}, booktitle = {Acta Physica Slovaca}, edition = {I.}, keywords = {Yttria stabilized zirconia; thin films; electrical conductivity; microhardness; refractive index; relative permitivity}, language = {eng}, location = {Bratislava}, isbn = {5-94691-216-X}, pages = {247-259}, publisher = {Institute of Physics, SAS, Bratislava, Slovakia}, title = {Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets}, year = {2005} }
TY - JOUR ID - 573078 AU - Hartmannová, Mária - Jergel, Martin - Navrátil, Vladislav - Navrátil, Karel - Gmucová, Katarina - Gandarilla, F.C. - Zemek, Jan - Chromik, Stefan - Kundracik, Frantiaek PY - 2005 TI - Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets PB - Institute of Physics, SAS, Bratislava, Slovakia CY - Bratislava SN - 594691216X KW - Yttria stabilized zirconia KW - thin films KW - electrical conductivity KW - microhardness KW - refractive index KW - relative permitivity N2 - The films under study were deposited by e-beam evaporation on yttria-stabilized zirconia crystalline samples on the n-doped Si (111) substrate at 750 C. The electrical conductivity and the activation energy as the function of the yttria content indicated the influence of isolated oxygen ion vacancies as well as the associated point defects.The measured microhardness data as well as a high refractive index render from YSZ a promising material for protective coatings and optical applications respectively. ER -
HARTMANNOVÁ, Mária, Martin JERGEL, Vladislav NAVRÁTIL, Karel NAVRÁTIL, Katarina GMUCOVÁ, F.C. GANDARILLA, Jan ZEMEK, Stefan CHROMIK and Frantiaek KUNDRACIK. Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets. In \textit{Acta Physica Slovaca}. I. Bratislava: Institute of Physics, SAS, Bratislava, Slovakia, 2005, p.~247-259. ISBN~5-94691-216-X.
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